Abstract
This work investigates the escalation of leakage power loss in today’s low power processors as their feature size shrinks rapidly. The problem seems to exacerbate as technology scaling dives steadily into Very Deep Submicron (VDSM). A quantitatively analysis has been carried out in several cache systems and has shown that the 1-way set associativity optimizes this power component across various generations.
Keywords
- Leakage Current
- Supply Voltage
- Leakage Power
- Cache System
- Leakage Loss
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Mohamed, N., Botros, N. (2007). Leakage Power Proliferation in Short Channel Cache Memories. In: Sobh, T. (eds) Innovations and Advanced Techniques in Computer and Information Sciences and Engineering. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-6268-1_62
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DOI: https://doi.org/10.1007/978-1-4020-6268-1_62
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-6267-4
Online ISBN: 978-1-4020-6268-1
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