Abstract
Domino logic circuits have been aggressively explored for vulnerabilities due to crosstalk noise. In these circuits, statistical modeling of crosstalk noise seems to be a promising approach due to factors like: large unpredictability in crosstalk noise with technology trends pushing process variations to their extreme end and reducing feature sizes ensuing unevenness in device geometries. We present here a general model for crosstalk noise with cross-coupling capacitive variance and MOS devices’ channel width variation effects and progressively refine it to get the most accurate circuit analysis model for deriving the crosstalk distribution. The statistical model derived is validated with 1000 runs of Monte Carlo simulations.
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Sharma, V., Al-Assadi, W.K. (2007). Statistical Modeling of Crosstalk Noise in Domino CMOS Logic Circuits. In: Elleithy, K. (eds) Advances and Innovations in Systems, Computing Sciences and Software Engineering. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-6264-3_81
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DOI: https://doi.org/10.1007/978-1-4020-6264-3_81
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-6263-6
Online ISBN: 978-1-4020-6264-3
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