Advertisement

Identification From Multi-Physics Full-Field Measurements at the Micrometer Scale: the Electro-Elastic Coupling

  • F. Amiot
  • F. Hild
  • F. Kanoufi
  • J. P. Roger
Conference paper

Abstract

We use metal coated micro-cantilevers as transducers from their electrochemical environment (Lavrik et al. [1]). Using the metallic layer of these cantilevers as a working electrode allows one to modify the electrochemical state of the cantilever surface. Since the mechanical behaviour of micrometer scale objects is significantly surface-driven, this environment modification induces a bending of the cantilever (Raiteri and Butt [2]). However, if the existence of this surface coupled phenomena has been demonstrated, the modelling of the connection between the electrochemical state of an interface and the induced deformation remains an open issue. Since one of the main difficulty is to ensure a uniform and well defined loading at the micrometer scale, it is thought that increasing the experimental information content may lead to a significant improvement of modelling, provided the redundancy of the measured quantity is sufficient. This statement is at the origin of the development of identification techniques based on full-field measurements in solids mechanics.

References

  1. 1.
    Lavrik, N.V., Sepaniak, M.J., Datskos, P.G., Cantilever transducers as a platform for chemical and biological sensors, Review of Scientific Instruments, vol. 75(7), 2229–2253, 2004.CrossRefGoogle Scholar
  2. 2.
    Raiteri, R., Butt, H.J., Measuring electrochemically induced surface stress with an atomic force microscope, J. Phys. Chem., vol. 99, 15728–15732, 1995.CrossRefGoogle Scholar
  3. 3.
    Amiot, F., Roger, J.P., Nomarski imaging interferometry to measure the displacement field of micro-electro-mechanical systems, Appl. Optics, vol. 45(30), 7800–7810, 2006.CrossRefGoogle Scholar
  4. 4.
    Stedman, M., Reflectance and ellipsometry of Metal/Electrolyte Interfaces, Trans. Faraday Soc., pp. 64–71,1970.Google Scholar

Copyright information

© Springer 2007

Authors and Affiliations

  • F. Amiot
    • 1
  • F. Hild
    • 2
  • F. Kanoufi
    • 3
  • J. P. Roger
    • 4
  1. 1.MIC-NanoDTU, TU. Denmark, Oersteds PladsDTU Building 345 east DK-2800 Kgs. LyngbyDenmark
  2. 2.LMT-Cachan / ENS Cachan / CNRS UMR-8535 / Université Paris VIFrance
  3. 3.LECA / ESPCI / CNRS UMR-7121France
  4. 4.LOP / ESPCI / CNRS UPR-A0005 / Université Paris VIFrance

Personalised recommendations