Electric-Field Induced Fatigue Crack Growth in Ferroelectric Single Crystals

  • F. Fang
  • W. Yang
  • F. C. Zhang
  • R. H. Wen
Conference paper


As one important class of the functional materials, ferroelectrics have been widely used as sensors, actuators, and transducers in smart structures. However, due to a strong electro-mechanical coupling, ferroelectrics suffer rather high stress under cyclic electric field. The low fracture toughness (lower than 1MPa·√m) and large switching strain render the reliability issue a bottleneck for the performance against crack propagation of ferroelectrics in smart structures. The importance for the reliability of ferroelectric materials gives a strong impetus for the studies on the crack propagation and the underlying mechanisms [1, 2, 3, 4, 5, 6, 7, 8, 9]. As fatigue crack growth in ferroelectric ceramics is often related with the grain boundary effects, a systematic study using single crystals is warranted for a better understanding of the electric-field-induced fatigue crack growth and its close relationship with the 90° domain switching.


Fatigue Crack Growth Applied Electric Field Ferroelectric Material Domain Switching Smart Structure 
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Copyright information

© Springer 2007

Authors and Affiliations

  • F. Fang
    • 1
  • W. Yang
    • 1
  • F. C. Zhang
    • 1
  • R. H. Wen
    • 1
  1. 1.Failure Mechanics Laboratory, School of AerospaceTsinghua UniveristyBeijingChina

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