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Inner-Shell Ionization in Xe Clusters Irradiated with X-Ray Laser Pulse

  • S. Namba
  • N. Hasegawa
  • M. Nishikino
  • T. Kawachi
  • M. Kishimoto
  • M. Tanaka
  • Y. Ochi
  • K. Nagashima
  • K. Takiyama
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 115)

Summary

The interaction of large xenon clusters with an x-ray laser pulse having a wavelength of 13.9 nm and intensity of up to 2x1010 W/cm2 was investigated using a time-of-flight ion mass spectrometer. The photon energy is high enough to photoionize the inner-shell electron of the Xe atom. In contrast to the experiment at synchrotron radiation, the enhancement of double Auger decay probability with increasing cluster size and x-ray laser intensity was observed for the first time.

Keywords

Stagnation Pressure Average Cluster Size Short Wavelength Laser Backing Pressure Double Auger 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer 2007

Authors and Affiliations

  • S. Namba
    • 1
  • N. Hasegawa
    • 2
  • M. Nishikino
    • 2
  • T. Kawachi
    • 2
  • M. Kishimoto
    • 2
  • M. Tanaka
    • 2
  • Y. Ochi
    • 2
  • K. Nagashima
    • 2
  • K. Takiyama
    • 1
  1. 1.Graduate school of EngineeringHiroshima University Higashi-HiroshimaHiroshimaJAPAN
  2. 2.Advanced Photon Research CenterJapan Atomic Energy Agency Souraku-gunKyotoJapan

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