Inner-Shell Ionization in Xe Clusters Irradiated with X-Ray Laser Pulse
The interaction of large xenon clusters with an x-ray laser pulse having a wavelength of 13.9 nm and intensity of up to 2x1010 W/cm2 was investigated using a time-of-flight ion mass spectrometer. The photon energy is high enough to photoionize the inner-shell electron of the Xe atom. In contrast to the experiment at synchrotron radiation, the enhancement of double Auger decay probability with increasing cluster size and x-ray laser intensity was observed for the first time.
KeywordsStagnation Pressure Average Cluster Size Short Wavelength Laser Backing Pressure Double Auger
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