Abstract
This chapter describes the possibilities of a pulsed laser system for studying radiation-induced single-event transients in integrated circuits. Three case studies are presented to illustrate the benefits of the spatial and temporal resolution of the technique. We use a dedicated software tool for analysing the transient responses obtained during laser testing. This software can extract all the information required for sensitivity evaluation or design hardening.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
P. Adell, R. D. Schrimpf, H. J. Barnaby, R. Marec, C. Chatry, P. Calvel, C. Barillot, and O. Mion, “Analysis of single-event transients in analog circuits,” Nuclear Science, IEEE Transactions on, vol. 47, no. 6, pp. 2616–2623, 2000.
D. Lewis, V. Pouget, F. Beaudoin, P. Perdu, H. Lapuyade, P. Fouillat, and A. Touboul, “Backside laser testing of ICs for SET sensitivity evaluation,” Nuclear Science, IEEE Transactions on, vol. 48, no. 6, pp. 2193–2201, 2001.
A. L. Sternberg, L. W. Massengill, R. D. Schrimpf, Y. Boulghassoul, H. J. Barnaby, S. Buchner, R. L. Pease, and J. W. Howard, “Effect of amplifier parameters on single-event transients in an inverting operational amplifier,” Nuclear Science, IEEE Transactions on, vol. 49, no. 3, pp. 1496–1501, 2002.
S. P. Buchner, T. J. Meehan, A. B. Campbell, K. A. Clark, and D. McMorrow, “Characterization of single-event upsets in a flash analog-to-digital converter (AD9058),” Nuclear Science, IEEE Transactions on, vol. 47, no. 6, pp. 2358–2364, 2000.
V. Pouget, D. Lewis, and P. Fouillat, “Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC,” Instrumentation and Measurement, IEEE Transactions on, vol. 53, no. 4, pp. 1227–1231, 2004.
S. Buchner, A. B. Campbell, A. Sternberg, L. Massengill, D. McMorrow, and C. Dyer, “Validity of using a fixed analog input for evaluating the SEU sensitivity of a flash analogto- digital converter,” Nuclear Science, IEEE Transactions on, vol. 52, no. 1, pp. 462–467, 2005.
Y. Boulghassoul, S. Buchner, D. McMorrow, V. Pouget, L. W. Massengill, P. Fouillat, W. T. Holman, C. Poivey, J. W. Howard, M. Savage, and M. C. Maher, “Investigation of millisecond-long analog single-event transients in the LM6144 op amp,” Nuclear Science, IEEE Transactions on, vol. 51, no. 6, pp. 3529–3536, 2004.
“IEEE Standard 181–2003 on Transitions, Pulses and Related Waveforms,” July1, 2003.
S. Buchner, J. Howard, Jr., C. Poivey, D. McMorrow, and R. Pease, “Pulsed-laser testing methodology for single event transients in linear devices,” Nuclear Science, IEEE Transactions on, vol. 51, no. 6, pp. 3716–3722, 2004.
V. Pouget, H. Lapuyade, P. Fouillat, D. Lewis, and S. Buchner, “Theoretical Investigation of an Equivalent Laser LET,” Microelectronics Reliability, vol. 41, no. 9–10, pp. 1513–1518, 2001.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2007 Springer
About this chapter
Cite this chapter
Pouget, V., Fouillat, P., Lewis, D. (2007). Using the SEEM Software for Laser SET Testing and Analysis. In: VELAZCO, R., FOUILLAT, P., REIS, R. (eds) Radiation Effects on Embedded Systems. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5646-8_12
Download citation
DOI: https://doi.org/10.1007/978-1-4020-5646-8_12
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-5645-1
Online ISBN: 978-1-4020-5646-8
eBook Packages: EngineeringEngineering (R0)