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A Multi-scale Model-Based Simulation of Thin Film Delamination

  • L.-M. Shen
  • Z. Chen

Keywords

Specimen Size Atomistic Simulation Failure Pattern Material Point Method Embed Atom Method Potential 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer 2006

Authors and Affiliations

  • L.-M. Shen
    • 1
  • Z. Chen
    • 1
  1. 1.Department of Civil and Environmental EngineeringUniversity of Missouri-ColumbiaColumbiaUSA

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