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© 2006 Springer
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Wei, YG., Xu, GS. (2006). Multi-scale Characterizations for Ductile Thin Film Delamination. In: Sun, Q.P., Tong, P. (eds) IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales., vol 142. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-4946-0_2
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DOI: https://doi.org/10.1007/978-1-4020-4946-0_2
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-4945-3
Online ISBN: 978-1-4020-4946-0
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