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Overview of E-Learning Environment for Web-Based Study of Testing and Diagnostics of Digital Systems

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Microelectronics Education

Abstract

In this paper, we present an overview of latest developments taking place at Tallinn Technical University (TTU) in the area of e-learning supported by European project REASON (REsearch And Training Action for System On Chip DesigN) [8].

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References

  1. M. Aarna, E. Ivask, A. Jutman, E. Orasson, J. Raik, R. Ubar, V. Vislogubov, H.D. Wuttke. “Turbo Tester — Diagnostic Package for Research and Training,” in Scientific-Technical Journal “Radioelectronics & Informatics”. KN U RE. Vol. 3(24), 2003, pp.69–73.

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  3. M.L. Bushnell, V.D. Agrawal, Essentials of Electronic Testing for Digital Memory and Mixed-Signal Circuits, Kluwer Academic Publishers, Dordrecht: 2000, p. 690.

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  4. G. Jervan, Z. Peng, R. Ubar. “Test Cost Minimization for Hybrid BIST,” IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems. Tokio, October 25–28, 2000, pp.283–291.

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  5. A. Jutman, R. Ubar, “Design Error Diagnosis in Digital Circuits with Stuck–at Fault Model,” Journal of Microelectronics Reliability. Pergamon Press, Vol. 40, No 2, 2000, pp.307–320.

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  6. R. Ubar. “Dynamic Analysis of Digital Circuits with Multi-Valued Simulation,” Microelectronics Journal, Elsevier Science Ltd., Vol. 29, No. 11, Nov. 1998, pp.821–826.

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  7. Turbo Tester home page URL: http://www.pid.ttu.ee/tt

  8. REASON project home page: http://reason.imio.pw.edu.pl

  9. Java applets home page: http://www.pid.ttu.ee/applets

  10. Laboratory training URL: http://www.pld.ttu.ee/testing/labs

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Author information

Authors and Affiliations

  1. Tallinn Technical University, ATI, Raja 15, 12618, Tallinn, Estonia

    A. Jutman & R. Ubar

  2. Technical University of Ilmenau, Helmholtzplatz 1, 98693, Ilmenau, Germany

    H.-D. Wuttke

Authors
  1. A. Jutman
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  2. R. Ubar
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  3. H.-D. Wuttke
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Editor information

Editors and Affiliations

  1. Swiss Federal Institute of Technology, Lausanne, Switzerland

    Adrian M. Ionescu , Michel Declercq , Maher Kayal  & Yusuf Leblebici , ,  & 

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© 2004 Springer Science+Business Media Dordrecht

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Jutman, A., Ubar, R., Wuttke, HD. (2004). Overview of E-Learning Environment for Web-Based Study of Testing and Diagnostics of Digital Systems. In: Ionescu, A.M., Declercq, M., Kayal, M., Leblebici, Y. (eds) Microelectronics Education. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-2651-5_41

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  • DOI: https://doi.org/10.1007/978-1-4020-2651-5_41

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-015-7052-7

  • Online ISBN: 978-1-4020-2651-5

  • eBook Packages: Springer Book Archive

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