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High-Pressure Crystallography pp 113–130Cite as

From Phase Identification to Structure Solution: X-Ray Crystallography at High Pressures

A practical approach applied to angular-dispersive data collected from large-volume samples

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Part of the book series: NATO Science Series ((NAII,volume 140))

Abstract

In this Chapter we give an overview of the use of modern powder diffraction techniques that are applied to real data collected with in angular-dispersive geometry at a state-ofthe-art synchrotron beamline, using large-volume apparatus to generate high-pressure and temperature conditions. The general theme is to obtain as much information as possible from the data, and we touch, without going into excessive detail, all steps that could be involved in any study undertaken at a beamline similar to ID30 at the ESRF. The techniques described here provide the basic grounding for all in situ investigations that couple this diffracting geometry with large-volume samples. The various stages of data collection and analysis are shown with examples, using, as far as possible, those programs that are freely available.

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Author information

Authors and Affiliations

  1. European Synchrotron Radiation Facility, B.P. 220, 38043, Grenoble CEDEX, France

    Wilson A. Crichton & Mohamed Mezouar

Authors
  1. Wilson A. Crichton
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  2. Mohamed Mezouar
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Editor information

Editors and Affiliations

  1. Faculty of Chemistry, Adam Mickiewicz University, Poznań, Poland

    Andrzej Katrusiak

  2. Department of Chemistry, University College London, UK

    Paul McMillan

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Crichton, W.A., Mezouar, M. (2004). From Phase Identification to Structure Solution: X-Ray Crystallography at High Pressures. In: Katrusiak, A., McMillan, P. (eds) High-Pressure Crystallography. NATO Science Series, vol 140. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-2102-2_8

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  • DOI: https://doi.org/10.1007/978-1-4020-2102-2_8

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-1954-8

  • Online ISBN: 978-1-4020-2102-2

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