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Part of the book series: Springer Series in Reliability Engineering ((RELIABILITY))

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Abstract

A number of NHPP based SRGM have been discussed in the previous chapters. These models treat the event of software fault detection/removal in the testing and operational phase as a counting process in discrete state space. If the size of software system is large, the number of software faults detected during the testing phase becomes large, and the change in the number of faults, which are detected and removed through debugging activities, becomes sufficiently small compared with the initial fault content at the beginning of the testing phase. Therefore, in such a situation, the software fault detection process can be well described by a stochastic process with a continuous state space. This chapter focuses on the development of stochastic differential equation based software reliability growth models to describe the stochastic process with continuous state space. Before developing any model we introduce the readers with the theoretical and mathematical background of stochastic differential equations.

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References

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Correspondence to H. Pham .

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Exercises

  1. 1.

    Under what condition one should apply stochastic differential equation based SRGM.

  2. 2.

    Define the following

    1. a.

      Stochastic process

    2. b.

      Brownian motion

    3. c.

      \( It\hat{O} \) Integrals

  3. 3.

    Fault detection rate per remaining fault is known to have irregular fluctuations, i.e., it is represented as \( b\left( t \right) + \sigma \gamma \left( t \right) \), where σγ(t) represents a standardized Gaussian white noise. In such a case the differential equation for basic SDE model is given by

    $$ {\frac{{{\text{d}}N\left( t \right)}}{{{\text{d}}t}}} = \left\{ {b\left( t \right) + \sigma \gamma \left( t \right)} \right\}\left\{ {a - N\left( t \right)} \right\}. $$

    Derive the solution of the above differential equation. Here N(t) is a random variable which represents the number of software faults detected in the software system up to testing time t.

    1. 4.

      Derive the Exponential SDE based software reliability growth model. Give the expression of instantaneous and cumulative MTBF for the model.

    2. 5.

      Using the real life software project data given below

      1. a.

        Compute the estimates of unknown parameters of the models M1–M4, M7 and M8.

      2. b.

        Analyze and compare the results of estimation based on root mean square prediction error.

      3. c.

        Draw the graphs for the goodness of fit.

    Testing time (days)

    Cumulative failures

    Testing time (days)

    Cumulative failures

    1

    2

    12

    24

    2

    3

    13

    26

    3

    4

    14

    30

    4

    5

    15

    31

    5

    7

    16

    37

    6

    9

    17

    38

    7

    11

    18

    41

    8

    12

    19

    42

    9

    19

    20

    45

    10

    21

    21

    46

    11

    22

      

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© 2011 Springer-Verlag London Limited

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Kapur, P.K., Pham, H., Gupta, A., Jha, P.C. (2011). SRGM Using SDE. In: Software Reliability Assessment with OR Applications. Springer Series in Reliability Engineering. Springer, London. https://doi.org/10.1007/978-0-85729-204-9_8

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  • DOI: https://doi.org/10.1007/978-0-85729-204-9_8

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  • Publisher Name: Springer, London

  • Print ISBN: 978-0-85729-203-2

  • Online ISBN: 978-0-85729-204-9

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