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Excursions in Harmonic Analysis, Volume 2 pp 311–332Cite as

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Enhancement and Recovery in Atomic Force Microscopy Images

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Part of the book series: Applied and Numerical Harmonic Analysis ((ANHA))

Abstract

Atomic force microscopy (AFM) images have become increasingly useful in the study of biological, chemical, and physical processes at the atomic level. The acquisition of AFM images takes more time than the acquisition of most optical images, so that the avoidance of unnecessary scanning becomes important. Details that are unclear from a scan may be enhanced using various image processing techniques. This chapter reviews various interpolation and inpainting methods and considers them in the specific application of AFM images. Lower-resolution AFM data is simulated by subsampling the number of scan lines in an image, and reconstruction methods are used to recreate an image on the original domain. The methods considered are classified in the categories of linear interpolation, nonlinear interpolation, and inpainting. These techniques are evaluated based on qualitative and quantitative measures, showing the extent to which scan times can be reduced while preserving the essence of the original features. A further application is in the removal of streaks, which can occur due to scanning errors and post-processing corrections. Identified streaks are removed, and the resulting unknown region is filled using inpainting.

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Acknowledgements

The authors would like to thank Todd Wittman, Jef Huang, and Kevin Thompson for useful conversations on the AFM and inpainting. This research is supported by NSF grant CBET-0940417. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the US Department of Energy under contract no. DE-AC02-05CH11231. Image of lipid bilayer domain sample provided by Elaine DeMasi.

Author information

Authors and Affiliations

  1. Department of Mathematics, UCLA, Los Angeles, CA, USA

    Alex Chen & Andrea L. Bertozzi

  2. Lawrence Berkeley National Laboratory, Molecular Foundry, Berkeley, CA, USA

    Paul D. Ashby

  3. CMLA, ENS Cachan, Mallemort, France

    Pascal Getreuer

  4. Georgia Institute of Technology, School of Electrical and Computer Engineering, Atlanta, GA, USA

    Yifei Lou

Authors
  1. Alex Chen
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  2. Andrea L. Bertozzi
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  3. Paul D. Ashby
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  4. Pascal Getreuer
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  5. Yifei Lou
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Corresponding author

Correspondence to Andrea L. Bertozzi .

Editor information

Editors and Affiliations

  1. , Department of Mathematics, University of Maryland, Norbert Wiener Center, College Park, 20742-0001, Maryland, USA

    Travis D. Andrews

  2. Norbert Wiener Center, Department of Mathematics, University of Maryland, College Park, 20742, Maryland, USA

    Radu Balan

  3. Department of Mathematics, University of Maryland, College Park, 20742-4015, Maryland, USA

    John J. Benedetto

  4. Department of Mathematics, University of Maryland, College Park, 20742-4015, Maryland, USA

    Wojciech Czaja

  5. , Department of Mathematics, University of Maryland, College Park, 20742, Maryland, USA

    Kasso A. Okoudjou

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Chen, A., Bertozzi, A.L., Ashby, P.D., Getreuer, P., Lou, Y. (2013). Enhancement and Recovery in Atomic Force Microscopy Images. In: Andrews, T., Balan, R., Benedetto, J., Czaja, W., Okoudjou, K. (eds) Excursions in Harmonic Analysis, Volume 2. Applied and Numerical Harmonic Analysis. Birkhäuser, Boston. https://doi.org/10.1007/978-0-8176-8379-5_16

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