Abstract
We present a marked point process reliability model that is based on failure and degradation data of repairable items operating in a dynamic environment. An item is regarded as failed when degradation reaches a critical threshold level or when a censoring traumatic event occurs. Degradation is modelled by a process with stationary independent increments and is related to external covariates through a random time scale. Traumatic events occur due to a point process with an intensity that may depend on degradation and external covariates. Parametric and semiparametric estimation is considered.
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Lehmann, A. (2004). On a Degradation-Failure Model for Repairable Items. In: Balakrishnan, N., Nikulin, M.S., Mesbah, M., Limnios, N. (eds) Parametric and Semiparametric Models with Applications to Reliability, Survival Analysis, and Quality of Life. Statistics for Industry and Technology. Birkhäuser, Boston, MA. https://doi.org/10.1007/978-0-8176-8206-4_5
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DOI: https://doi.org/10.1007/978-0-8176-8206-4_5
Publisher Name: Birkhäuser, Boston, MA
Print ISBN: 978-1-4612-6491-0
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