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An Approach to System Reliability Demonstration Based on Accelerated Test Results on Components

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Advances in Degradation Modeling

Part of the book series: Statistics for Industry and Technology ((SIT))

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Abstract

Reliability demonstration is often mandatory for industries that need to prove the quality of their production. In a reliability objective at the global system level, the basic use of standards such as MIL-HDBK-781 or IEC-60300 for reliability demonstration of each sub-system must be adjusted. Practitioners often have to fix high-level reliability goals (around 0.999) on each sub-system to guarantee that system reliability exceeds 0.8. Moreover, the confidence obtained for an overall reliability drops down to non-admissible values because of the multiplicity of testing procedures. We propose an approach, from k accelerated tests, to determine an optimized test time whilst ensuring that the reliability of a component system is greater than a goal value and by avoiding the too conservative method consisting in multiplying the confidence levels.

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References

  1. Abernethy, R.B. (2004). The New Weibull Handbook. Abernethy, North Palm Beach, FL.

    Google Scholar 

  2. Cocozza-Thivent, C. (1997). Processus stochastiques et fiabilité des systémes. Springer, Berlin.

    Google Scholar 

  3. Gnedenko, B.V. and Ushakov, I.A. (1995). Probabilistic Reliability Engineering. John Wiley & Sons, New York.

    Book  Google Scholar 

  4. IEC 61124 (1997). Reliability testing – Compliance tests for constant failure rate and constant failure intensity, IEC Standard.

    Google Scholar 

  5. IEC 60300 (2001). Dependability management, Part 3-5: Reliability centered maintenance, IEC Standard.

    Google Scholar 

  6. Meeker, W.Q. and Escobar, L.A. (1998). Statistical Methods for Reliability Data. John Wiley & Sons, New York.

    Google Scholar 

  7. MIL-HDBK-781 (1997). Handbook for Reliability Test Methods, Plans, and Environments for Engineering, Development Qualification, and Production. John Wiley & Sons, New York.

    Google Scholar 

  8. Pages, A. and Gondran, M. (1980). Fiabilité des systémes. Collection de la Direction des Etudes et Recherches d’Electricité de France, 39. Editions Eyrolles. XXII, Paris.

    Google Scholar 

  9. Rausand, M. and Hoyland, A. (2004). System Reliability Theory: Models and Statistics Methods, Second Edition. John Wiley & Sons, New York.

    MATH  Google Scholar 

  10. Rinne, H. (2009). The Weibull Distribution: A Handbook. CRC Press, Boca Raton, FL. xxiv.

    Google Scholar 

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Gerville-Réache, L., Couallier, V. (2010). An Approach to System Reliability Demonstration Based on Accelerated Test Results on Components. In: Nikulin, M., Limnios, N., Balakrishnan, N., Kahle, W., Huber-Carol, C. (eds) Advances in Degradation Modeling. Statistics for Industry and Technology. Birkhäuser Boston. https://doi.org/10.1007/978-0-8176-4924-1_20

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