The distribution, morphology, and stability of material phases govern the bulk properties of virtually all of the technologically relevant materials used to design engineering components and products. Phase identification and characterization are therefore critical to the development and use of practical materials. In this chapter, we will focus on the application of electron backscatter diffraction (EBSD) to phase identification.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Baba-Kishi KZ (1998) Measurement of crystal parameters on backscatter Kikuchi diffraction patterns. Scanning 20: 117–127
Baba-Kishi KZ (2002) Review: Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analyses. J Mater Sci 37:1715–1746
Baba-Kishi KZ, Dingley DJ (1989a) Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups. Scanning 11:305–312
Baba-Kishi KZ, Dingley DJ (1989b) Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2. J Appl Cryst 22:189–200
Cieslak MJ, Headley TJ, Romig AD Jr (1986) The welding metallurgy of HASTELLOY alloys C-4, C-22, and C-276. Metall Trans A 17A:2035–2047
Davis JR (ed) (1997) Heat resistant materials. ASM Specialty Handbook. ASM International, Materials Park, OH
Goehner RP, Michael JR (1996) Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns. J Res Natl Inst Stand Technol 101:301–308
Gourgues-Lorenzon AF (2007) Application of electron backscatter diffraction to the study of phase transformations. Int Mater Rev 52:65–128
Heubner UL, Altpeter E, Rockel MB et al (1989) Electrochemical behavior and its relation to composition and sensitization of NiCrMo alloys in ASTM G-28 solution. Corrosion 42:249–259
Hodge FG, Kirchner RW (1976) An improved Ni–Cr–Mo alloy for corrosion service. Corrosion 32:332–336
Leonard RB (1969) Thermal stability of Hastelloy alloy C-276. Corrosion 25:222–228
Michael JR, Eades JA (2000) Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis. Ultramicroscopy 81:67–81
Raghavan M, Berkowitz BJ, Scanlon JC (1982) Electron microscopic analysis of heterogeneous precipitates in Hastelloy C-276. Metall Trans A 13A:979–984
Acknowledgments
Part of this work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory, in part under Contract W-7405-Eng-48 and in part under Contract DE-AC52-07NA27344.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2009 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
El-Dasher, B., Deal, A. (2009). Application of Electron Backscatter Diffraction to Phase Identification. In: Schwartz, A., Kumar, M., Adams, B., Field, D. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-88136-2_6
Download citation
DOI: https://doi.org/10.1007/978-0-387-88136-2_6
Published:
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-88135-5
Online ISBN: 978-0-387-88136-2
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)