Abstract
We see phase contrast any time we have more than one beam contributing to the image. In fact, whenever we say “fringes,” we are essentially referring to a phase-contrast phenomenon. Although we often distinguish phase and diffraction contrast, this distinction is generally artificial. For example, in Chapters 24 and 25, we will examine thickness fringes and stackingfault fringes; both types of contrast result from interference of waves so both are phasecontrast images although we usually think of them as two-beam, diffraction-contrast images.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
We encourage you to delve into the early papers on moiré fringes. Search the literature for those by Pashley, Stowell, et al. on Au islands on mica.
The books by Hirsch et al. (1977), Horiuchi (1994), and De Graef (2003) are useful references. That by Spence (2003) is essential follow-up reading (and described in Chapter 1).
Special Topics
Boersch, H, Hamisch, H, Wohlleben, D and Grohmann, K 1920 Z. Phys. 159 397–404. The original analysis of interference fringes from domain walls.
Bursill, LA, Barry, JC, Hudson, PRW 1978 Fresnel Diffraction at {100} Platelets in Diamond Phil. Mag. A37 789–812.
Heavens, OS and Ditchburn, RW 1991 Insight into Optics p 73 John Wiley & Sons New York. Gives a clear treatment of Fresnel fringes.
Hetherington, CJD and Dahmen, U 1992 Scanning Microscopy Supplement 6 p 405 Scanning Microscopy International AMF O'Hare IL.
Krivanek, OL and Rez, P 1980 Proc. 38th Ann. EMSA Meeting p 170 Ed. GW Bailey Claitors Baton Rouge LA.
MoirÉ Fringes
Menter, JW 1956 The Direct Study by Electron Microscopy of Crystal Lattices and Their Imperfections Proc. Roy. Soc. (London) A236 119–135. Classic early work.
Norton, MG and Carter, CB 1995 Moiré Patterns and Their Application to the Study of the Growth of YBa 2 Cu 3 O 7-δ Thin Films J. Mater. Sci. 30 381–389. Islands of YBCO.
Rühle, M and Wilkens, M 1975 Defocusing Contrast of Cavities; Theory Cryst. Lattice Defects 6 129–400. Voids—the definitive work.
Vincent, R 1969 Analysis of Residual Strains in Epitaxial Thin Films Phil. Mag. 19 1127–1139. Showing the magical size effect using moirés.
Wilkens, M 1975 in Electron Microscopy in Materials Science II p 647 Eds. U Valdré and E Ruedl CEC Brussels. A clear explanation of the use of Fresnel fringe theory to analyze voids.
Fresnel Fringes, Surfaces, And Layers of Glass
Clarke, DR 1979 On The Detection of Thin Intergranular Films by Electron Microscopy Ultramicrosc. 4 33–44.
Fukushima, K, Kawakatzu, H and Fukami, A 1974 J. Phys. D7 257. Just surfaces.
Longworth, S 2006 Ph.D. Thesis, Cambridge University. Concludes that the Fresnel fringe technique is not reliable for measuring amorphous films.
Ness, JN, Stobbs, WM and Page, TF 1986 A TEM Fresnel Diffraction-Based Method for Characterizing Interfacial Films Phil. Mag. 54 679–702.
Rasmussen, DR and Carter, CB 1990 On the Fresnel-Fringe Technique for the Analysis of Interfacial Films Ultramicrosc. 32 337–348.
Rasmussen, DR, Simpson, YK, Kilaas, R and Carter, CB 1989 Contrast Effects at Grooved Interfaces Ultramicrosc. 30 52–55.
Simpson, YK, Carter, CB, Morrissey, KJ, Angelini, P and Bentley, J 1986 Identification of Thin Amorphous Films at Grain-Boundaries in Al 2 O 3 J. Mater. Sci. 21 2689–2696. Discussion of different techniques for characterizing these layers.
Fresnel Fringes Interfaces
Carter, CB, Elgat, Z and Shaw, TM 1987 Lateral Twin Boundaries in Spinel Phil. Mag. 55 21–38. Tubes along GBs.
Ross, FM and Stobbs, WM 1991a Study of the Initial Stages of the Oxidation of Silicon Using the Fresnel Method Phil. Mag. A63 1–36.
Ross, FM and Stobbs, WM 1991b Computer Modelling for Fresnel Contrast Analysis Phil. Mag. A63 37–70. The inner potential.
Rühle, M and Sass, SL 1984 Detection of the Change in Mean Inner Potential at Dislocations in Grain Boundaries in NiO Phil. Mag. A49 759–782. Individual dislocations with different Burgers vectors show different Fresnel contract.
Tafto, J, Jones, RH and Heald, SM 1986 Transmission Electron Microscopy of Interfaces Utilizing Mean Inner Potential Differences Between Materials J. Appl. Phys. 60 4316–4318.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2009 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Williams, D.B., Carter, C.B. (2009). Phase-Contrast Images. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-76501-3_23
Download citation
DOI: https://doi.org/10.1007/978-0-387-76501-3_23
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-76500-6
Online ISBN: 978-0-387-76501-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)