One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key parameters affecting performance of integrated circuits [6]. Several taxonomies can be used to describe the different variability mechanisms, according to their causes, spatial scales, the particular IC layer they impact, and whether their ability can be described using non-stochastic models. Here we briefly discuss these taxonomies.
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© 2008 Springer Science+Business Media, LLC
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(2008). Front End Variability. In: Design for Manufacturability and Statistical Design. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-69011-7_2
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DOI: https://doi.org/10.1007/978-0-387-69011-7_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-30928-6
Online ISBN: 978-0-387-69011-7
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