Excursion Probabilities for Smooth Fields

Part of the Springer Monographs in Mathematics book series (SMM)


As we have mentioned more than once before, one of the oldest and most important problems in the study of stochastic processes of any kind is to evaluate the excursion probabilities where f is a random process over some parameter set T . As usual, we shall restrict ourselves to the case in which f is centered and Gaussian and T is compact for the canonical metric of (1.3.1).


Critical Variance Euler Characteristic Piecewise Smooth Critical Radius Reproduce Kernel Hilbert Space 
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© Springer Science+Business Media LLC 2007

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