Abstract
This paper proposes an adapted diagnoser for manufacturing systems. This diagnoser combines event and state based models to infer the fault’s occurrence using event sequences and state conditions characterized by sensor’s readings and commands issued by the controller. Furthermore, this diagnoser uses expectation functions to capture the inherent temporal dynamics of the system represented by time delays between correlated events.
Keywords
- Manufacture System
- Fault Diagnosis
- Event Sequence
- Output Vector
- Fault Mode
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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5. References
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Sayed-Mouchaweh, M., Philippot, A., Carré-Ménétrier, V., Riera, B. (2006). Timed-Event-State-Based Diagnoser for Manufacturing Systems. In: Information Technology For Balanced Manufacturing Systems. BASYS 2006. IFIP International Federation for Information Processing, vol 220. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-36594-7_44
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DOI: https://doi.org/10.1007/978-0-387-36594-7_44
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-36590-9
Online ISBN: 978-0-387-36594-7
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