Abstract
This papers describes a new technique for on-line testing of analog circuits based on plant recognition by adaptive algorithms. To the authors knowledge, this is the first time such technique is used to on-line testing of analog circuits, allowing complete fault coverage. The paper presents the testing methodology and experimental results showing easy detection of soft, large-deviation and hard faults, with a low cost digital processor. Components variations as low as 10% have been detected, as the comparison parameter (output error power) varied from 300% to 20%.
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© 1997 Springer Science+Business Media Dordrecht
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Negreiros, M., Carro, L. (1997). On-line testing of analog circuits by adaptive filters. In: Reis, R., Claesen, L. (eds) VLSI: Integrated Systems on Silicon. IFIP — The International Federation for Information Processing. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-35311-1_5
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DOI: https://doi.org/10.1007/978-0-387-35311-1_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-6949-4
Online ISBN: 978-0-387-35311-1
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