Abstract
We present in this paper a language to describe tests for ASN.1 data structures. The main problem in test data generation is to derive from abstract data structures consistently inputs which are effective to find faults in the system under test. The cause is twofold. First, semantic information is not included with the ASN.1 declarations. Second, since the test input space is generally infinite, we must relay on external statements of the properties of the tests we want to use. The intention of this paper is to formalize semantic informations description in ASN.1 and to define a formalism which allow the description of test data. A test description language is then proposed to bridge the large gap between ASN.1 specifications and actual test inputs.
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© 1996 Springer Science+Business Media Dordrecht
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Kabore, P., Schaff, A. (1996). TDL: an ASN.1-based tests description language. In: Baumgarten, B., Burkhardt, HJ., Giessler, A. (eds) Testing of Communicating Systems. IFIP — The International Federation for Information Processing. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-35062-2_20
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DOI: https://doi.org/10.1007/978-0-387-35062-2_20
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