Abstract
The effects of stress on fault generation in both structured and functional design methodologies were quantitatively determined through a controlled experiment. Two teams developed the same software program under the same stressed conditions, except for design methodologies. The degree of stress was measured by inner metrics we proposed (Furuyama, 1994-b). The results of the analysis show that (1) the generation rate of faults caused by mental stress of the team who developed a software program using functional design methodology was higher than that of the other team, which used structured design methodology; (2) among the faults caused by human nature, many seemed to be correlated to stress at higher stress levels, so that faults caused by stress were considered to be generated by developers much more than they reported them; and (3) physical stress could generate faults at a higher rate than mental stress when it appeared even for a short period, independent of design methodology.
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© 1996 Springer Science+Business Media Dordrecht
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Furuyama, T., Arai, Y., Iio, K. (1996). Analysis of fault generation caused by stress during software development. In: Bologna, S., Bucci, G. (eds) Achieving Quality in Software. IFIP — The International Federation for Information Processing. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-34869-8_2
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DOI: https://doi.org/10.1007/978-0-387-34869-8_2
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