Skip to main content

Nanoindentation Test Instruments

  • Chapter
Nanoindentation

Part of the book series: Mechanical Engineering Series ((MES))

  • 640 Accesses

Abstract

Interest in nanoindentation has spawned a number of nanoindentation instruments that compete on a world market. Purchasers of such instruments are universities, private and government research organisations, and quality control laboratories. There is particular interest within the semiconductor industry that is concerned with the mechanical properties of a wide range of thin films. All of the products described in this chapter are depth-sensing devices. The instruments typically measure depth of penetration using either a changing inductance or capacitance displacement sensor. A typical nanoindentation test instrument has a depth resolution of less than a tenth of a nanometre and a force resolution of less than a nanonewton. The load can be applied by the expansion of the piezoelectric element, the movement of a coil in a magnetic field, or electrostatically. Maximum loads are usually limited to the millinewton range. The minimum load is usually less than a micronewton.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 74.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. “MTS,” “Nano,” and “Nano Indenter” are registered trademarks of MTS Systems Corporation, Nano Instruments Innovation Center, 1001 Larson Drive, Oak Ridge, TN 37830 USA.

    Google Scholar 

  2. J.B. Pethica, “Microhardness tests with penetration depths less than ion implanted layer thickness in ion implantation into metals,” Third International Conference on Modification of Surface Properties of Metals by Ion-Implantation, Manchester, England, 23-26, 1981, V. Ashworth et al. eds. Pergammon Press, Oxford, 1982, pp. 147–157.

    Google Scholar 

  3. B.N. Lucas, W.C. Oliver, and J.E. Swindeman, “The dynamics of frequency-specific, depth sensing indentation testing,” Mat. Res. Soc. Symp. Proc. 522, 1998, pp. 3–14.

    Article  CAS  Google Scholar 

  4. W.C. Oliver and J.B. Pethica, “Method for continuous determination of the elastic stiffness of contact between two bodies,” United States Patent, 4848141, 1989.

    Google Scholar 

  5. COMOS is a registered trademark of Structural Research and Analysis Corporation.

    Google Scholar 

  6. Micro Materials Ltd., Unit 3, The Byre, Wrexham Technology Park, Wrexham LL13 7YP, United Kingdom.

    Google Scholar 

  7. Hysitron Inc., 5251 West 73rd Street, Minneapolis, MN, 55439 USA.

    Google Scholar 

  8. W.A. Bonin and Hysitron Inc., “Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system,” United States Patent, 5553486, 1996.

    Google Scholar 

  9. W.A. Bonin and Hysitron Inc., “Capacitive transducer with electrostatic actuation,“ United States Patent, 5576483, 1996.

    Google Scholar 

  10. W.A. Bonin and Hysitron Inc., “Multi-dimensional capacitive transducer,” United States Patent, 5661235, 1997.

    Google Scholar 

  11. W.A. Bonin and Hysitron Inc., “Multi-dimensional capacitive transducer,” United States Patent, 5869751, 1999

    Google Scholar 

  12. W.A. Bonin and Hysitron Inc., “Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system,” United States Patent, 6026677, 2000.

    Google Scholar 

  13. CSEM Instruments, Jaquet-Droz 1, P.O Box 41, CH-2007 Neuchâtel Switzerland.

    Google Scholar 

  14. N. X. Randall, C. Julia-Schmutz, J. M. Soro, J. von Stebut, and G. Zacharie, “Novel nanoindentation method for characterising multiphase materials,” Thin Solid Films, 308-309, 1997, pp. 297–303.

    Article  CAS  Google Scholar 

  15. CSIRO, Bradfield Rd, West Lindfield, NSW 2070 Australia.

    Google Scholar 

  16. J.S. Field, “Penetrating measuring instrument,“ United States Patent, 5067346, 1991.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 2002 Springer Science+Business Media New York

About this chapter

Cite this chapter

Fischer-Cripps, A.C. (2002). Nanoindentation Test Instruments. In: Nanoindentation. Mechanical Engineering Series. Springer, New York, NY. https://doi.org/10.1007/978-0-387-22462-6_9

Download citation

  • DOI: https://doi.org/10.1007/978-0-387-22462-6_9

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4899-0515-4

  • Online ISBN: 978-0-387-22462-6

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics