Multi-level test generation and fault diagnosis for finite state machines

  • R. Ubar
  • M. Brik
Session 6 Testing
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1150)


In this paper, a new multi-level technique, based on alternative graphs, with uniform procedures at each level for test generation, fault simulation and fault diagnosis in finite state machines (FSM) is presented. For the description of function (behavior), structure and faults in FSM, three levels are used: functional (state transition diagrams), logical (signal path) and gate levels. In test generation, simultaneously all levels are used. Faults from different classes are inserted and activated at different levels by uniform procedures. State initialization and fault propagation are carried out only at the functional level. Backtracking will not cross level borders, hence, the high efficiency of test generation can be reached. Fault diagnosis is carried out using top-down technique, keeping the complexity of candidate fault sets in each level as low as possible.


Boolean Function Fault Diagnosis Test Generation Fault Model Test Pattern 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Berlin Heidelberg 1996

Authors and Affiliations

  • R. Ubar
    • 1
  • M. Brik
    • 1
  1. 1.Tallinn Technical UniversityTallinnEstonia

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