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Pseudorandom testing of microprocessors at instruction/data flow level

  • Janusz Sosnowski
  • A. Kuśmierczyk
Session 6 Testing
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1150)

Abstract

A universal approach to testing microprocessors is described. It is based on a test program with pseudorandom stream of instructions and data. An original software generator of such programs has been presented. Theoretical studies and many simulation experiments show that the proposed approach has similar properties to pseudorandom testing at the circuit level and covers a lot of fault models.

Keywords

Test Sequence Register File Test Length External Tester Transient Fault 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1996

Authors and Affiliations

  • Janusz Sosnowski
    • 1
  • A. Kuśmierczyk
    • 1
  1. 1.Institute of Computer ScienceWarsaw University of TechnologyWarsawPoland

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