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Results of switching-closure-test on FEAL

Extended abstract
  • Hikaru Morita
  • Kazuo Ohta
  • Shoji Miyaguchi
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 739)

Abstract

The closure tests, CCT and MCT, were introduced to analyze the algebraic properties of cryptosystems by Kaliski et al. [KaRiSh]. If a cryptosystem is closed, the tests give the same results “Fail” and the cryptosystem might be breakable. Though CCT requires much less memory and time than MCT, we cannot apply CCT to check cryptosystems having the same data and key block lengths such as FEAL with non-parity mode. Because CCT utilizes the differences in data and key block lengths.

Though CCT experiments performed by Kaliski et al. detected that DES is not closed, how should FEAL be checked? Does FEAL pass in MCT? Since MCT needs a lot of memory and time, to check FEAL, we developed a switching closure test SCT [MoOhMi], which is practical version of MCT. In this paper, by using SCT, it is confirmed that FEAL is not closed with high probability.

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References

  1. [KaRiSh]
    B. S. Kaliski Jr., R. L. Rivest, and A. T. Sherman: “Is the Data Encryption Standard a Group? (Results of Cycling Experiments on DES),” J. Cryptology, 1, 1, pp.3–36, 1988.CrossRefGoogle Scholar
  2. [MoOhMi]
    H. Morita, K. Ohta, and S. Miyaguchi: “A Switching Closure Test to Analyze Cryptosystems,” Abstracts of CRYPTO'91, pp.4.14–4.18, Aug. 1991.Google Scholar
  3. [Ni]
    K. Nishimura: “Probability to Meet in the Middle,” J. Cryptology, 2, 1, pp. 13–22, 1990.Google Scholar
  4. [QuDe]
    J.-J. Quisquater and J.-P. Delescaille: “How Easy is Collision Search. New Results and Applications to DES,” Advances in Cryptology-CRYPTO'89, Proceedings, pp.408–413, Springer-Verlag, 1990.Google Scholar
  5. [ShMi]
    A. Shimizu and S. Miyaguchi: “Fast Data Encipherment Algorithm FEAL,” Advances in Cryptology-EUROCRYPT'87, Proceedings, pp.267–278, Springer-Verlag, 1988. See also S. Miyaguchi, et al.: “Expansion of FEAL Cipher,” NTT Review, 2, 6, pp.117–127, Nov. 1990.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1993

Authors and Affiliations

  • Hikaru Morita
    • 1
  • Kazuo Ohta
    • 1
  • Shoji Miyaguchi
    • 1
  1. 1.NTT LaboratoriesNTT R&D Center (Room 309A)KanagawaJapan

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