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Principles of Holographic Interferometry and Speckle Metrology

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Photomechanics

Part of the book series: Topics in Applied Physics ((TAP,volume 77))

Abstract

Because of their nonintrusive, real-time and full-field features, holographic interferometry [1,2,3,4,5,6,7,8,9,10] and speckle metrology [11,12,13,14,15] [16,17,18,19] have received considerable attention in experimental mechanics. As a result, a broad range of measurement possibilities have emerged that are capable of handling challenges that applications pose to test methods. The active interest in these fields is testified by a proliferation of research papers that these fields have produced over the last three decades. It would thus be illusive to attempt to cover the subject in depth and in its entirety in the present review. The intent of this chapter is limited to describing a sample of approaches and techniques applied to deformation analysis and shape measurements, and to presenting examples drawn from these areas. The main emphasis is on giving the reader some appreciation of the variety of basic procedures that have been developed over the years for deformation measurement.

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  1. Stress Analysis Laboratory, Swiss Federal Institute of Technology Lausanne, CH-1015, Lausanne, Switzerland

    Pramod K. Rastogi

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    Pramod K. Rastogi

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Rastogi, P.K. (2000). Principles of Holographic Interferometry and Speckle Metrology. In: Rastogi, P.K. (eds) Photomechanics. Topics in Applied Physics, vol 77. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48800-6_4

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