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Photomechanics pp 55–102Cite as

Fringe Analysis

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Part of the book series: Topics in Applied Physics ((TAP,volume 77))

Abstract

Fringe analysis is the process of extracting quantitative measurement data from fringe — or line — patterns. It usually consists of phase detection and phase unwrapping. Phase detection is the calculation of the fringes phase from the recorded intensity patterns, and this issue represents the major part of the material in this review. Different techniques for this phase calculation are presented, with special emphasis on the characteristic polynomial method, allows us permits to easily design customized algorithms coping with many error sources. For reference, a table presenting the properties of almost all algorithms which have been in recent years is provided in the Appendix. A generic method allowing us to quantitatively evaluate the phase errors and the effect of noise is presented here for the first time. Finally, some elements regarding the complex problem of phase unwrapping are given.

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Author information

Authors and Affiliations

  1. National Institute of Metrology, CNAM/INM, 292, rue St.Martin, F-75141, Paris Cedex 03, France

    Yves Surrel

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  1. Yves Surrel
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Editors and Affiliations

  1. Stress Analysis Laboratory IMAC-DGC, Swiss Federal Institute of Technology, 1015, Lausanne, Switzerland

    Pramod K. Rastogi

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© 2000 Springer-Verlag Berlin Heidelberg

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Surrel, Y. (2000). Fringe Analysis. In: Rastogi, P.K. (eds) Photomechanics. Topics in Applied Physics, vol 77. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48800-6_3

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  • DOI: https://doi.org/10.1007/3-540-48800-6_3

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-65990-7

  • Online ISBN: 978-3-540-48800-2

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