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The Effect of Annealing on the Electrical Resistivity of Thin Silver Films

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Part of the Springer Tracts in Modern Physics book series (STMP,volume 223)

Abstract

The electrical resistivity of polycrystalline metal films usually decreases during an annealing treatment. Figure 3.1 shows a typical example measured for silver films deposited at 77 K on a glass substrate and subsequently annealed for 1 h at the temperature T A (filled circles [1]). Measuring temperature was always 77 K.

Keywords

  • Electrical Resistivity
  • Work Function
  • Thin Solid Film
  • Dielectric Function
  • Silver Atom

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Wißmann, P., Finzel, HU. (2007). The Effect of Annealing on the Electrical Resistivity of Thin Silver Films. In: Electrical Resistivity of Thin Metal Films. Springer Tracts in Modern Physics, vol 223. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48490-6_3

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