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Electrical Resistivity of Thin Metal Films pp 3–7Cite as

The Scattering Hypothesis

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Part of the Springer Tracts in Modern Physics book series (STMP,volume 223)

Abstract

The scattering hypothesis is based on the assumption that Matthiessen’s rule can be applied, i.e. all scattering contributions compose additively [1] according

Keywords

  • Scatter Cross Section
  • Excess Charge
  • Permanent Dipole Moment
  • Asperity Height
  • Mulliken Population Analysis

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Author information

Authors and Affiliations

  1. Institut für Physikalische und Theoretische Chemie, Universität Erlangen-Nürnberg, Egerlandstr. 4, 91058, Erlangen, Germany

    Peter Wißmann Professor

  2. Hochschule Niederrhein, FB Chemie, Adlerstr. 32, 47798, Krefeld, Germany

    Hans-Ulrich Finzel Professor

Authors
  1. Peter Wißmann Professor
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  2. Hans-Ulrich Finzel Professor
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Wißmann, P., Finzel, HU. (2007). The Scattering Hypothesis. In: Electrical Resistivity of Thin Metal Films. Springer Tracts in Modern Physics, vol 223. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48490-6_2

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