Advertisement

A Tool and a Formalism to Design and Apply Patterns

  • Agnés Conte
  • Mounia Fredj
  • Ibtissem Hassine
  • Jean-Pierre Giraudin
  • Dominique Rieu
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 2425)

Abstract

Patterns systems are becoming more and more numerous. They offer product patterns or process patterns of varied range and cover (analysis, design or implementation patterns, and general, domain or enterprise patterns). New application development environments have been developed together with these pattern-oriented approaches and should address two kinds of actors: patterns engineers who specify patterns systems, and applications engineers who use these systems to specify information systems. Nevertheless, most of the existing development environments are made for applications engineers; they offer few functionalities allowing definition and organization of patterns systems. This paper presents AGAP, a development environment for defining and using patterns, which distinguishes pattern formalisms from patterns systems. Not only does AGAP address applications engineers, but it also allows patterns engineers to define patterns systems in order to increase the level of reuse. We illustrate the use of AGAP by the presentation of P-Sigma, a common formalism for patterns representation. P-Sigma expresses a semantics common to most of the existing formalisms and standardizes the expression of product patterns and process patterns. It allows to clarify the patterns selection interface and facilitates the organization of patterns systems.

Keywords

Pattern patterns system reuse product pattern process pattern pattern formalism pattern-based development environment 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    ACM: Software Patterns, Communications of the ACM, vol. 39, n° 10, 1996.Google Scholar
  2. 2.
    Alexander, C.: The Timeless Way of Building, Oxford University Press, 1979.Google Scholar
  3. 3.
    Ambler, S.W.: Process Patterns building Large Scale Systems using Object technology, SIGS Books, Cambridge University Press, December 1998.Google Scholar
  4. 4.
    Berrut, C., Front-Conte, A.: Patterns retrieval system: first attempt, 5th International Conference on Applications of Natural Language to Information Systems (NLDB’2000), Versailles, June 2000.Google Scholar
  5. 5.
    Borne, I., Revault, N.: Comparaison d’outils de mise en oeuvre de design patterns, Object-oriented Patterns, Vol5, num2, 1999.Google Scholar
  6. 6.
    Buschmann, F., Meunier R., & al.: Pattern-Oriented Software Architecture: A System of Patterns, Wiley & Sons, 1996.Google Scholar
  7. 7.
    Casati, C., Castano, S., Fugini, M.G., Mirbel, I., Pernici, B.: WERDE: a pattern-based tool for exception design in workflows, proceedings of SEBD 98, Ancona, 1998.Google Scholar
  8. 8.
    Cauvet, C., Rieu, D., Ramadour, P., Front-Conte, A.: Réutilisation dans l’ingénierie des systémes d’information, Chapitre de l’ouvrage Ingénierie des systémes d’information du Traité IC2-Information-Commande-Communication, Hermès, Février 2001.Google Scholar
  9. 9.
    Chambers, C., Harrison, B., Vlissides, J.: A Debate on Language and Tool Support for Design Patterns, PLOP’00, 2000.Google Scholar
  10. 10.
    Coad, P., North D., Mayfield, M.: Object Models-Strategies, Patterns and Application, Yourdon Press Computing Series, 1995.Google Scholar
  11. 11.
    Eden, A.H.: Precise Specification of Design Patterns and Tool Support in Their Application, PhD Thesis, Department of Computer Science, Tel Aviv University, 2000.Google Scholar
  12. 12.
    Fowler, M.: Analysis Patterns. Reusable Object Models, Addison-Wesley, 1997.Google Scholar
  13. 13.
    Front-Conte, A., Giraudin, J.P., Rieu, D., Saint-Marcel, C.: Réutilisation et patrons d’ingénierie, Chapitre de l’ouvrage Génie Objet: Analyse et Conception de l’Evolution, Editeur M. Oussalah, Hermés, 1999.Google Scholar
  14. 14.
    Gamma, E., Helm, R., Johnson, R.E., Vlissides, J.: Design patterns: Elements of Reusable Object-Oriented Software, Addison-Wesley, 1995.Google Scholar
  15. 15.
    Gruijs, D.: A Framework of Concepts for Representing Object-Oriented Design and Design Patterns, Masters Thesis, Utrecht University, CS Dept., INF-SCR-97-28, 1997.Google Scholar
  16. 16.
    Gzara, L., Rieu, D., Tollenaere, M.: Pattern Approach To Product Information Systems Engineering, Requirements Engineering Journal, Editors: Peri Loucopoulos & Colin Potts, Springer-Verlag, London, LTD., 2000.Google Scholar
  17. 17.
    Johnson, R.E.: Documenting Frameworks using Patterns, OOPSLA’92, 1992.Google Scholar
  18. 18.
    Maiden, N., Sutcliffe, A., Taylor, C., Till, D.: A set of formal problem abstractions for reuse during requirements engineering, ISI, Hermes, vol. 2, n° 6, pp. 679–698, 1994.Google Scholar
  19. 19.
    Meijler, T.D., Demeyer, S., Engel, R.: Making design patterns explicit in face, in European Software Engineering Conference (ESEC/FSE 97), 1997.Google Scholar
  20. 20.
    Rieu, D., Giraudin, J-P.: L’Objet, Numéro spécial Patrons orientés objet, Vol. 5, n° 2, Hermés, 1999.Google Scholar
  21. 21.
    Pagel, B., Winter, M.: Toward pattern-based tools, EuroPLoP’96,1996.Google Scholar
  22. 22.
    Portland: About the Portland Form, http://c2.com/ppr/about/portland.html, 1994.
  23. 23.
    Rolland, C., Prakash, N., Benjamen, A.: A multi-model view of process modeling, Requirements Engineering Journal, pp 169–187, 1999.Google Scholar
  24. 24.
    Welke, R.J., Kumar, K.: Method Engineering: a proposal for Situation-specific Methodology Construction, in Systems Analysis and Design: a Research Agenda, Cotterman and Senn (eds), Wiley, pp 257–268, 1992.Google Scholar
  25. 25.
    Wirfs-Brock, R., Wilkerson, B., Weiner, L.: Designing Object-Oriented Software Prentice-Hall, Englewood Cliffs, New Jersey, 1990.Google Scholar
  26. 26.
    Rieu, D., Giraudin, J.P., Conte A.: Pattern-Based Environments for Information Systems Development, International Conference, The Sciences of Design, 15–16 mars 2002, Lyon, France.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2002

Authors and Affiliations

  • Agnés Conte
    • 1
  • Mounia Fredj
    • 1
  • Ibtissem Hassine
    • 1
  • Jean-Pierre Giraudin
    • 1
  • Dominique Rieu
    • 1
  1. 1.LSR-IMAG, SIGMASaint Martin D’Heres CedexFrance

Personalised recommendations