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Double Quantum Dots as Detectors of High-Frequency Quantum Noise in Mesoscopic Conductors

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Statistical and Dynamical Aspects of Mesoscopic Systems

Part of the book series: Lecture Notes in Physics ((LNP,volume 547))

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Abstract

In this work we propose a measurement set-up for detecting quantum noise over a wide frequency range using inelastic transitions in a tunable two-level system as a detector. Recently, two device structures were realized that can be used as tunable two-level systems. In a superconducting single-electron transistor a Cooper-pair [1] and in a double quantum dot an electron [2] can make inelastic transitions between two discrete energy states. The transition rate for levels separated by an energy ∈, is a measure of the spectral density of the fluctuations in the enviroment at a frequency f = ∈/h. In our set-up the frequency-resolving detector consists of a double quantum dot which is capacitively coupled to the leads of a nearby mesoscopic conductor. The inelastic current through the double quantum dot is calculated in response to equilibrium and non-equilibrium current fluctuations in the nearby conductor, including vacuum fluctuations at very low temperatures. As a specific example, the fluctuations across a quantum point contact are discussed.

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References

  1. Y. Nakamura, C. D Chen and J. S. Tsai, Phys. Rev. Lett. 79, 2328(1997).

    Article  CAS  Google Scholar 

  2. T. Fujisawa et al, Science 282, 932 (1998).

    Article  CAS  Google Scholar 

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© 2000 Springer-Verlag Berlin Heidelberg

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Aguado, R., Kouwenhoven, L.P. (2000). Double Quantum Dots as Detectors of High-Frequency Quantum Noise in Mesoscopic Conductors. In: Reguera, D., Rubí, J.M., Platero, G., Bonilla, L.L. (eds) Statistical and Dynamical Aspects of Mesoscopic Systems. Lecture Notes in Physics, vol 547. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45557-4_26

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  • DOI: https://doi.org/10.1007/3-540-45557-4_26

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-67478-8

  • Online ISBN: 978-3-540-45557-8

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