Skip to main content

Test Suite Reduction and Fault Detecting Effectiveness: An Empirical Evaluation

  • Conference paper
  • First Online:
Book cover Reliable SoftwareTechnologies — Ada-Europe 2001 (Ada-Europe 2001)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2043))

Included in the following conference series:

Abstract

Test suite reduction is aimed at finding representative sets that can satisfy the same testing objective as their original test suite. As a subset of the original test suite, the representative set may have less fault detection capability. However, researches show that a representative set and its original test suite have similar fault detection capabilities for the case of coverage based criteria. This paper investigates the relationship between the fault detection capabilities of a representative set and its original test suite when the generation of the test suite is based on some fault-based test case selection criteria.

Corresponding author.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. T.Y. Chen and M.F. Lau, A new heuristic for test suite reduction, Information and Software Technology, 40(5-6):347–354, 1998.

    Article  Google Scholar 

  2. T.Y. Chen, M.F. Lau, and Y.T. Yu, MUMCUT: A fault-based strategy for testing Boolean specifications, In Proceedings of APSEC’99, pp. 606–613, 1999.

    Google Scholar 

  3. J.J. Chilenski and S.P. Miller, Applicability of modified condition/decision coverage to software testing, Software Engineering Journal, 9(5):193–200, 1994.

    Article  Google Scholar 

  4. R.A. DeMillo, R.J. Lipton, and F.G. Sayward, Hints on test data selection: Help for the practicing programmer, Computer, 11(4):34–41, 1978.

    Article  Google Scholar 

  5. R.A. DeMillo and A.J. Offutt, Constraint-based automatic test data generation, IEEE Trans. on Software Engineering, 17(9):900–910, 1991.

    Article  Google Scholar 

  6. K.A. Foster, Error sensitive test cases analysis (estca), IEEE Trans. on Software Engineering, 6(2):258–264, 1980.

    Article  Google Scholar 

  7. K.A. Foster, Sensitive test data for logic expressions, ACM SIGSOFT Software Engineering Notes, 9(2):120–125, 1984.

    Article  Google Scholar 

  8. D.D. Givone, Introduction to Switching Circuit Theory, McGraw-Hill, 1970.

    Google Scholar 

  9. B. Korel, Automated software test data generation, IEEE Trans. on Software Engineering, 16(8):870–879, 1990.

    Article  Google Scholar 

  10. N.G. Leveson, M.P.E. Heimdahl, H. Hildreth, and J.D. Reese, Requirements specification for process-control systems, IEEE Trans. on Software Engineering, 20(9):684–707, 1994.

    Article  Google Scholar 

  11. G.J. Myers, The Art of Software Testing, John Wiley, Second edition, 1979.

    Google Scholar 

  12. W.V. Quine, The problem of simplifying truth functions, American Mathematical Monthly, 59:521–531, 1952.

    Article  MATH  MathSciNet  Google Scholar 

  13. C.V. Ramamoorthy, S.-B.F. Ho, and W.T. Chen, On the automated generation of program test data, IEEE Trans. on Software Engineering, 2(4):293–300, 1976.

    Article  Google Scholar 

  14. K.C. Tai, Condition-based software testing strategies, In Proceedings of COMPSAC 90, pp. 564–569, Washington, DC, 1990.

    Google Scholar 

  15. K.C. Tai, Theory of fault-based predicate testing for computer programs, IEEE Trans. on Software Engineering, 22(8):552–563, 1996.

    Article  Google Scholar 

  16. K.C. Tai and H.K. Su, Test generation for boolean expressions, In Proceedings of COMPSAC 87, pp. 278–284, Washington, DC, 1987.

    Google Scholar 

  17. W.T. Tsai, D. Volovik, and T.F. Keefe, Automated test case generation for programs specified by relational algebra queries, IEEE Trans. on Software Engineering, 16(3):316–324, 1990.

    Article  Google Scholar 

  18. E.J. Weyuker, T. Goradia, and A. Singh, Automatically generating test data from a boolean specification, IEEE Trans. on Software Engineering, 20(5):353–363, 1994.

    Article  MATH  Google Scholar 

  19. W.E. Wong, J.R. Horgan, S. London, and A.P. Mathur, Effect of test set minimization on fault detection effectiveness, Software-Practice and Experience, 28(4):347–369, 1998.

    Article  Google Scholar 

  20. W.E. Wong, J.R. Horgan, A.P. Mathur, and A. Pasquini, Test set size minimization and fault detection effectiveness: A case study in a space application, The Journal of Systems and Software, 48:79–89, 1999.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2001 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Chen, T.Y., Lau, M.F. (2001). Test Suite Reduction and Fault Detecting Effectiveness: An Empirical Evaluation. In: Craeynest, D., Strohmeier, A. (eds) Reliable SoftwareTechnologies — Ada-Europe 2001. Ada-Europe 2001. Lecture Notes in Computer Science, vol 2043. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45136-6_20

Download citation

  • DOI: https://doi.org/10.1007/3-540-45136-6_20

  • Published:

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-42123-8

  • Online ISBN: 978-3-540-45136-5

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics