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© 2005 Springer Berlin Heidelberg
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(2005). Effects of defects on electrophysical and functional parameters in semiconducting structures and devices. In: Gettering Defects in Semiconductors. Springer Series in Advanced Microelectronics, vol 19. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29499-6_3
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DOI: https://doi.org/10.1007/3-540-29499-6_3
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-26244-2
Online ISBN: 978-3-540-29499-3
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