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The metastable defect in boron-doped Czochralski silicon

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Lifetime Spectroscopy

Part of the book series: Springer Series in Material Science ((SSMATERIALS,volume 85))

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(2005). The metastable defect in boron-doped Czochralski silicon. In: Lifetime Spectroscopy. Springer Series in Material Science, vol 85. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-27922-9_6

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