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Scanning Probe Methods in the Magnetic Tape Industry

  • James K. Knudsen
Part of the NanoScience and Technology book series (NANO)

Keywords

Magnetic Tape Magnetic Surface Magnetic Force Microscopy Magnetic Force Microscopy Image Tape Drive 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Jones RE, Mee CD, Tsang C (1996) Recording heads. In: Mee CD, Daniel ED (eds) Magnetic recording technology, 2nd edn. McGraw-Hill, New YorkGoogle Scholar
  2. 2.
    Bhushan B (1996) Tribology of the head-medium interface. In: Mee CD, Daniel ED (eds) Magnetic recording technology, 2nd edn. McGraw-Hill, New YorkGoogle Scholar
  3. 3.
    Mallinson JC (1993) The foundations of magnetic recording, 2nd edn. Academic Press, San DiegoGoogle Scholar
  4. 4.
    Jorgensen F (1995) The complete handbook of magnetic recording, 4th edn. TAB Books, Blue Ridge Summit, PAGoogle Scholar
  5. 5.
    Mee CD, Daniel ED (1996) (eds) Magnetic recording technology, 2nd edn. McGraw-Hill, New YorkGoogle Scholar
  6. 6.
    Bhushan B (1990) Tribology and mechanics of magnetic storage devices. Springer, Berlin Heidelberg New YorkGoogle Scholar
  7. 7.
    Bhushan B (1999) Principles and applications of tribology. Wiley, New YorkGoogle Scholar
  8. 8.
    Richards DB, Sharrock MP (1998) IEEE Trans Magn 34:1878CrossRefGoogle Scholar
  9. 9.
    Inaba H, Ejiri K, Abe N, Masaki K, Araki H (1993) IEEE Trans Magn 29:3607CrossRefGoogle Scholar
  10. 10.
    Saitoh S, Inaba H, Kashiwagi A (1995) IEEE Trans Magn 31:2859CrossRefGoogle Scholar
  11. 11.
    Bhushan B, Khatavkar DV (1995) Wear 190:16CrossRefGoogle Scholar
  12. 12.
    Magonov SN, Reneker DH (1997) Annu Rev Mater Sci 27:175CrossRefGoogle Scholar
  13. 13.
    Magonov S (2004) Visualization of polymer structures with atomic force microscopy. In: Bhushan B, Fuchs H, Hosaka S (eds) Applied scanning probe methods. Springer, Berlin Heidelberg New YorkGoogle Scholar
  14. 14.
    Kasai T, Bhushan B, Huang L, Su C (2004) Nanotechnology 15:731CrossRefGoogle Scholar
  15. 15.
    Sourty E, Sullivan JL, De Jong LAM (2003) IEEE Trans Magn 39:1859CrossRefGoogle Scholar
  16. 16.
    Tsuchiya T, Bhushan B (1995) Tribol Trans 38:941Google Scholar
  17. 17.
    Thomas TR (1999) Rough surfaces, 2nd edn. Imperial College Press, LondonGoogle Scholar
  18. 18.
    Greenwood JA (1967) ASME J Lub Technol 89:81Google Scholar
  19. 19.
    Mummery L (1990) Surface texture analysis: the handbook. Hommelwerke, MulhausenGoogle Scholar
  20. 20.
    Johnson KL (1985) Contact mechanics. Cambridge University PressGoogle Scholar
  21. 21.
    Greenwood JA, Williamson JBP (1966) Proc R Soc London Ser A 295:300CrossRefGoogle Scholar
  22. 22.
    Bhushan B (1984) ASME J Trib 106:26CrossRefGoogle Scholar
  23. 23.
    Wu Y, Talke FE (1996) IEEE Trans Magn 32:160CrossRefGoogle Scholar
  24. 24.
    Bhushan B (1998) Tribol Lett 4:1CrossRefGoogle Scholar
  25. 25.
    Lacey C, Talke FE (1992) ASME J Trib 114:646CrossRefGoogle Scholar
  26. 26.
    Tan S, Talke FE (1999) IEEE Trans Magn 35:770CrossRefGoogle Scholar
  27. 27.
    Tan S, Talke FE (1999) IEEE Trans Magn 35:2382CrossRefGoogle Scholar
  28. 28.
    Lin GH, Xing X, Johnson KE, Bertram HN (1997) IEEE Trans Magn 33:950CrossRefGoogle Scholar
  29. 29.
    Bertram HN (1994) Theory of magnetic recording. Cambridge University PressGoogle Scholar
  30. 30.
    Coutellier J-M, Bertram HN (1987)IEEE Trans Magn 23:195CrossRefGoogle Scholar
  31. 31.
    Roesler A, Zhu J-G (2001) IEEE Trans Magn 37:1059CrossRefGoogle Scholar
  32. 32.
    Ganti S, Bhushan B (1995) Wear 180:17CrossRefGoogle Scholar
  33. 33.
    Majumdar A, Bhushan B (1991) ASME J Trib 113:1Google Scholar
  34. 34.
    Khamesee MR, Kurosaki Y, Matsui M, Murai K (2004) Mater Trans 45:469CrossRefGoogle Scholar
  35. 35.
    Russ JC (1994) Fractal surfaces. Plenum Press, New YorkGoogle Scholar
  36. 36.
    Majumdar A, Tien CL (1990) Wear 136:313CrossRefGoogle Scholar
  37. 37.
    Bhushan B (1996) IEEE Trans Magn 32:1819CrossRefGoogle Scholar
  38. 38.
    Sato S, Arisaka Y, Matsumura S (1999) IEEE Trans Magn 35:2760CrossRefGoogle Scholar
  39. 39.
    Rugar D, Mamin HJ, Guenther P, Lambert SE, Stern JE, McFryden I, Yogi T (1990) J Appl Phys 68:1169CrossRefGoogle Scholar
  40. 40.
    Koblischa MR, Hartmann U (2003) Ultramicroscopy 97:103CrossRefGoogle Scholar
  41. 41.
    Ruhrig M, Porthun S, Lodder JC, McVitie S, Heyderman LJ, Johnston AB, Chapman JN (1996) J Appl Phys 79:2913CrossRefGoogle Scholar
  42. 42.
    Ruhrig M, Prothun S, Loder JC (1994) Rev Sci Instrum 65:3224CrossRefGoogle Scholar
  43. 43.
    Skidmore GD, Dahlberg ED (1997) Appl Phys Lett 71:3293CrossRefGoogle Scholar
  44. 44.
    Phillips GN, Siekman MH, Abelmann L, Lodder JC (2002) Appl Phys Lett 81:865CrossRefGoogle Scholar
  45. 45.
    Liu Z, Dan Y, Jinjun Q, Wu Y (2002) J Appl Phys 91:8843CrossRefGoogle Scholar
  46. 46.
    Wastlbauer G, Skidmore GD, Merton C, Schmidt J, Dahlberg ED, Skorjanec J (2000) Appl Phys Lett 76:619CrossRefGoogle Scholar
  47. 47.
    Hopkins PF, Moreland J, Malhotra SS, Liou SH (1996) J Appl Phys 79:6448CrossRefGoogle Scholar
  48. 48.
    Liou SH, Malhotra SS, Moreland J, Hopkins PF (1997) Appl Phys Lett 70:135CrossRefGoogle Scholar
  49. 49.
    Teschke O (2001) Appl Phys Lett 79:2773CrossRefGoogle Scholar
  50. 50.
    Wu Y, Shen Y, Liu Z, Li K, Qiu J (2003) Appl Phys Lett 82:1748CrossRefGoogle Scholar
  51. 51.
    Craik DJ (1994) The observation of magnetic domains. In: Coleman RV (ed) Methods of experimental physics, vol 11. Academic Press, New YorkGoogle Scholar
  52. 52.
    Chen J, Saito H, Ishio S, Kobayashi K (1999) J Appl Phys 85:1037CrossRefGoogle Scholar
  53. 53.
    Takahashi M, Kikuchi A, Hara H, Shoji H (1998) IEEE Trans Magn 34:1573CrossRefGoogle Scholar
  54. 54.
    Ozawa T, Doushita H, Harasawa T (2004) US patent 6,713,171Google Scholar
  55. 55.
    Svedberg EB, Khizroev S, Litvinov D (2002) J Appl Phys 91:5365CrossRefGoogle Scholar
  56. 56.
    Jander A, Dhagat RS, Indeck RS, Muller MW (1998) IEEE Trans Magn 34:1657CrossRefGoogle Scholar
  57. 57.
    Proksch R, Runge E, Hansma PK, Foss S, Walsh B (1995) J Appl Phys 78:3303CrossRefGoogle Scholar
  58. 58.
    Kuo HV, Merton C, Dahlberg ED (2001) J Magn Magn Mater 226:2046CrossRefGoogle Scholar
  59. 59.
    Walsh B, Austvold S, Proksch R (1998) J Appl Phys 84:5709CrossRefGoogle Scholar
  60. 60.
    Liu F, Li S, Liu Y, Gray G, Schultz A (2002) J Appl Phys 91:6842CrossRefGoogle Scholar
  61. 61.
    Li S, Zhu W, Wang L, Palmer D (2003) J Appl Phys 93:8531CrossRefGoogle Scholar
  62. 62.
    Wago K, Sueoka K, Sai F (1991) IEEE Trans Magn 27:5178CrossRefGoogle Scholar
  63. 63.
    Bailey W, Wang SX, Cain WC (1995) IEEE Trans Magn 31:3120CrossRefGoogle Scholar
  64. 64.
    Hoyt RF, Helm DE, Best JS, Horng CT, Horne DE (1984) J Appl Phys 55:2241CrossRefGoogle Scholar
  65. 65.
    Proksch R, Neilson P, Austvold S, Schmidt JJ (1999) Appl Phys Lett 74:1308CrossRefGoogle Scholar
  66. 66.
    Abe M, Tanaka Y (2001) J Appl Phys 98:6766CrossRefGoogle Scholar
  67. 67.
    Abe M, Tanaka Y (2002) IEEE Trans Magn 38:45CrossRefGoogle Scholar
  68. 68.
    Gibson GA, Schultz S, Carr T, Jagielinski T (1992) IEEE Trans Magn 28:2310CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • James K. Knudsen
    • 1
  1. 1.Woodbury

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