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Experimental Methods

Part of the Advanced Texts in Physics book series (ADTP)

Keywords

Probe Beam Streak Camera Quantum Structure Excited Species Dephasing Time 
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References to Chap. 25

  1. [31G1]
    M. Göppert-Mayer, Ann. Phys. 9, 273 (1931)Google Scholar
  2. [57K1]
    R. Kubo, J. Phys. Soc. Japan, 12, 570 (1957)Google Scholar
  3. [59M1]
    P.C. Martin and J. Schwinger, Phys. Rev., 115, 1342 (1959)CrossRefGoogle Scholar
  4. [65B1]
    N. Bloembergen, Nonlinear Optics, Benjamin, New York (1965)Google Scholar
  5. [69C1]
    M. Cardona, Modulation Spectroscopy, Academic Press, New York (1969)Google Scholar
  6. [71K1]
    C. Klingshirn, Z. Phys. 248, 433 (1971)Google Scholar
  7. [72B1]
    R.J. Bell, Introductory Fourier-Transform Spectroscopy, Academic Press, New York (1972)Google Scholar
  8. [73B1]
    J. Bille, Festkörperprobleme / Advances in Solid State Physics 13, 111 (1973)Google Scholar
  9. [73B2]
    E. Beckmann, I. Broser, R. Broser, in Luminescence of Crystals, Molecules and Solutions, F. Williams (ed.), Plenum Press, New York 155 (1973)Google Scholar
  10. [73S1]
    B.O. Seraphin, Modulation Spectroscopy, North-Holland, Amsterdam (1973)Google Scholar
  11. [75K1]
    C. Klingshirn, phys. stat. sol. (b) 71, 547 (1975)Google Scholar
  12. [76R1]
    W. Richter, Resonant Raman Scattering in Semiconductors, Springer Tracts Mod. Phys., Springer, Heidelberg (1976)Google Scholar
  13. [77A1]
    R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam (1977)Google Scholar
  14. [77M1]
    R.S. Markiewicz, J.P. Wolfe and C.D. Jeffries, Phys. Rev. B 15, 1988 (1977)CrossRefGoogle Scholar
  15. [78H1]
    J.M. Hvam, J. Appl. Phys. 49, 3124 (1978)CrossRefGoogle Scholar
  16. [78S1]
    J.R. Salcedom et al.: Phys. Rev. Lett. 41, 131 (1978)Google Scholar
  17. [78Y1]
    T. Yajima and H. Souma, Phys. Rev. A 17, 309 (1978)Google Scholar
  18. [78Y2]
    T. Yajima, H. Souma and Y. Ishida, Phys. Rev. A 17, 324 (1978)Google Scholar
  19. [79S1]
    H. Schrey, V. Lyssenko, and C. Klingshirn, Sol. State Commun. 32, 897 (1979)CrossRefGoogle Scholar
  20. [80A1]
    V.F. Agekyan and A.A. Berezhnaya, Sov. Phys. Semicond., 14, 1002 (1980)Google Scholar
  21. [80M1]
    M.G. Moharam, T.K. Gaylord and R. Magnusson, Opt. Commun. 32, 19 (1980)Google Scholar
  22. [81B1]
    K. Bohnert et al.: Z. Phys. B 42, 1 (1981)CrossRefGoogle Scholar
  23. [81B2]
    G. Blattner et al., phys. stat. sol. (b) 107, 105 (1981)Google Scholar
  24. [81C1]
    W.F. Croydon, and E.H.C. Parker, Dielectric Films on Gallium Arsenide, Gordon and Breach, New York (1981)Google Scholar
  25. [81J1]
    W.B. Jackson et al.: Appl. Opt. 20, 1333 (1981)Google Scholar
  26. [81K1]
    G. Kido et al.: J. Phys. E: Sci. Instrum. 14, 349 (1981)CrossRefGoogle Scholar
  27. [81K2]
    C. Klingshirn and H. Haug, Phys. Rep. 70, 315 (1981)CrossRefGoogle Scholar
  28. [82H1]
    M.C. Hutley, Diffraction Gratings, Academic Press, London (1982)Google Scholar
  29. [82I1]
    M. Itoh and I. Ogura, J. Appl. Phys. 53, 5140 (1982)CrossRefGoogle Scholar
  30. [82L1]
    Landolt-Börnstein, New Series, Group III, Vol. 17a, O. Madelung, ed. Springer, Berlin (1982), or 41a (2001)Google Scholar
  31. [82S1]
    D.G. Seiler et al., Phys. Rev. B 25, 7666 (1982)CrossRefGoogle Scholar
  32. [83F1]
    R. Fork et al.: IEEE J. Quantum Electron. 19, 500 (1983)CrossRefGoogle Scholar
  33. [83M1]
    M.L. Meade, Lock-in Amplifiers: Principles and Applications, IEE electrical measurement series, Peregrinus, London (1983)Google Scholar
  34. [83M2]
    Y. Masumoto, S. Shionoya and T. Takagahra, Phys. Rev. Lett. 51, 923 (1983)CrossRefGoogle Scholar
  35. [83S1]
    D.G. Seiler et al.: Phys. Rev. B 27, 2355 (1983)CrossRefGoogle Scholar
  36. [84K1]
    K. Kempf and C. Klingshirn, Sol. State Commun. 49, 23 (1984)CrossRefGoogle Scholar
  37. [84S1]
    Y.R. Shen, The Principles of Nonlinear Optics, Wiley, New York (1984)Google Scholar
  38. [85H1]
    B. Hönerlage et al.: Phys. Rep. 124, 161 (1985)Google Scholar
  39. [85M1]
    F.A. Majumder et al.: Phys. Rev. B 32, 2407 (1985)CrossRefGoogle Scholar
  40. [85T1]
    T. Takagahra Phys. Rev. B 31, 8171 (1985)Google Scholar
  41. [86E1]
    H.J. Eichler, P. Günter and D.W. Pohl, Laser-Induced Dynamic Gratings, Springer Ser. Opt. Sci. 50, Springer, Berlin (1986)Google Scholar
  42. [86L1]
    Laser Spectroscopy of Solids, W.M. Yen and P.M. Selzer, eds., Top. Appl. Phys., Vol. 49, Springer, Berlin (1986)Google Scholar
  43. [86M1]
    Murphyś Laws, Books I to III, A. Bloch ed., Price/Stern/Sloan, Los Angeles (1986)Google Scholar
  44. [86W1]
    M. Wegener et al., Semicond. Science and Technol. 1, 366 (1986)Google Scholar
  45. [87B1]
    I. Bar-Joseph et al, Appl. Phys. Lett. 50, 1010 (1987)CrossRefGoogle Scholar
  46. [87H1]
    C. Hirlimann, Rev. Phys. Appl. 22, 1673 (1987)Google Scholar
  47. [87T1]
    W.J. Tomlinson and W.H. Knox, JOSA B 4, 1404 (1987)Google Scholar
  48. [88H1]
    G. Hernandez, Fabry-Perot Interferometers, Cambridge Studies in Mod. Optics 3, Cambridge (1988)Google Scholar
  49. [88J1]
    A. Juhl and D. Bimberg, J. Appl. Phys. 64, 303 (1988)CrossRefGoogle Scholar
  50. [88K1]
    W.H. Knox, IEEE J. Quantum Electron. 24, 388 (1988)CrossRefGoogle Scholar
  51. [88R1]
    R. Renner et al., J. Cryst. Growth 86, 581 (1988)Google Scholar
  52. [88S1]
    H.E. Swoboda et al., Z. Phys. 70, 341 (1988)CrossRefGoogle Scholar
  53. [88U1]
    I.N. Uraltsev et al., phys. stat. sol. (b) 150, 673 (1988)Google Scholar
  54. [88W1]
    Ch. Weber et al., Z. Phys. B 72, 379 (1988)CrossRefGoogle Scholar
  55. [88Z1]
    J.E. Zucker, A. Pinczuk and D.S. Chemla, Phys. Rev. B 38, 4287 (1988)CrossRefGoogle Scholar
  56. [89C1]
    J. Christen and D. Bimberg, Rev. Phys. Appl. Colloq. C6, Supplément au no 6, C6–85 (1989)Google Scholar
  57. [89D1]
    C. Dörnfeld and J.M. Hvam, IEEE J. Quantum Electron. 25, 904 (1989)Google Scholar
  58. [89L1]
    Laser Spectroscopy of Solids II, W.M. Yen ed., Top. Appl. Phys., Vol. 65, Springer, Berlin (1989)Google Scholar
  59. [89S1]
    S. Shionoya et al., eds., Springer Proc. Phys. 38 (1989)Google Scholar
  60. [89S2]
    Spectroscopy of Semiconductors, G. Fasol, A. Fasolino and P. Lugli, eds., NATO ASI Ser. B 206, Plenum Press, New York (1989)Google Scholar
  61. [89S3]
    M. Schiekamp et al., Phys. Rev. D 40, 3077 (1989)Google Scholar
  62. [89W1]
    Ch. Weber et al., Appl. Phys. Lett. 54, 2432 (1989)Google Scholar
  63. [90K1]
    W.H. Knox et al., Optics and Photonics News, April Issue p. 44 (1990)Google Scholar
  64. [90L1]
    G. Livescu et al.: J. Electron. Mater. 19, 937.Google Scholar
  65. [90L2]
    J.D. Lambkin et al., Appl. Phys. Lett. 57, 1986 (1990)CrossRefGoogle Scholar
  66. [90O1]
    M. Olszakier et al., J. Lumin. 45, 186 (1990)Google Scholar
  67. [90W1]
    T. Wilson, ed., Confocal Microscopy, Academic Press, New York (1990)Google Scholar
  68. [91B1]
    D. Bimberg, T. Wolf, and J. Böhrer, NATO ASI Ser. B 249, 529, Plenum Press, New York (1991)Google Scholar
  69. [91D1]
    W. Demtröder, Laserspektroskopie, Springer, Berlin (1991)Google Scholar
  70. [91H1]
    M.A. Hermann, D. Bimberg and J. Christen, J. Appl. Phys. 70, R1 (1991)Google Scholar
  71. [91M1]
    D.L. Mills, Nonlinear Optics, Springer, Berlin (1991)Google Scholar
  72. [91T1]
    M.L. Thoma, Ch. Weber and C., Klingshirn, Appl. Phys. A 52, 255 (1991)CrossRefGoogle Scholar
  73. [92B1]
    G. Bongionvanni, A. Mura and J.L. Staehli, phys. stat. sol. (b) 173, 355 (1992)Google Scholar
  74. [92B2]
    O. Brandt et al., Phys. Rev. B 45, 3803 (1992)Google Scholar
  75. [92D1]
    B. Di Bartolo, ed., Optical Properties of Excited States in Solids, NATO ASI Ser. B 301, Plenum Press, New York (1992)Google Scholar
  76. [92E1]
    K.J. Ebeling, Integrierte Optoelektronik, 2nd ed., an English version is available, Springer, Berlin (1992)Google Scholar
  77. [92F1]
    B.D. Fluegel et al., Sol. State Commun. 83, 17 (1992)CrossRefGoogle Scholar
  78. [92G1]
    E.O. Göbel et al., phys. stat. sol. (b) 173, 21 (1992)Google Scholar
  79. [92J1]
    D.S. Jiang et al., Superlattices Microstruct. 12, 273 (1992)Google Scholar
  80. [92M1]
    R.M. Macfarlane, NATO ASI Ser. B 301, 399, Plenum Press, New York (1992)Google Scholar
  81. [92O1]
    D. Oberhauser et al., phys. stat. sol. (b) 173, 53 (1992)Google Scholar
  82. [92S1]
    G. Sucha, S.R. Bolton and D.S. Chemla, IEEE J. Quantum Electron. 28, 2163 (1992)CrossRefGoogle Scholar
  83. [92S2]
    H. Schwab et al., phys. stat. sol. (b) 172, 479 (1992)Google Scholar
  84. [93B1]
    D. Bimberg and J. Christen, Inst. Phys. Conf. Ser. No 134, 629 (1993)Google Scholar
  85. [93H1]
    H. Haug and S.W. Koch, Quantum Theory of the Optical and Electronic Properties of Semiconductors, 2nd ed., World Scientific, Singapore (1993)Google Scholar
  86. [93H2]
    C.I. Harris et al., J. Phys. IV 3 C5, 171 (1993)Google Scholar
  87. [93K1]
    W. Kaiser ed., Ultrashort Laserpulses, 2nd.ed., Top. Appl. Phys. 60, Springer, Berlin (1993)Google Scholar
  88. [93K2]
    H. Kalt et al.. Physica B 191, 90 (1993)CrossRefGoogle Scholar
  89. [93M1]
    K. Meissner et al., Phys. Rev. B 48, 15472 (1993)CrossRefGoogle Scholar
  90. [93O1]
    Optics of Semiconductor Nanostructures, F. Henneberger, S. Schmitt-Rink and E.O. Göbel, eds., Akademie Verlag, Berlin (1993)Google Scholar
  91. [93P1]
    S. Permogorov et al., Solid State Commun. 88, 705 (1993)CrossRefGoogle Scholar
  92. [93S1]
    W. Schoenlein et al., Phys. Rev. Lett. 70, 1014 (1993)CrossRefGoogle Scholar
  93. [93S2]
    R. De Salvo et al., Opt. Lett. 18, 193 (1993)Google Scholar
  94. [93T1]
    R. Trebino and D.J. Kane, J. Opt. Soc. Am. A 10, 1101 (1993)CrossRefGoogle Scholar
  95. [93V1]
    M. Vening, D.J. Dunstan and K.P. Homewood, Phys. Rev. B 48, 2412 (1993)CrossRefGoogle Scholar
  96. [93W1]
    S. Weiss et al., Appl. Phys. Lett. 63, 2567 (1993)CrossRefGoogle Scholar
  97. [94B1]
    J.-Y. Bigot et al., in Coherent Optical Interactions in Semiconductors, R.T. Phillips,ed., Plenum Press, New York, p. 245 (1994)Google Scholar
  98. [94D1]
    E. Dünschede et al., Philos. Mag. B 70, 443 (1994)Google Scholar
  99. [94F1]
    F. Fuchs et al., Supperlattices Microstruct. 16, 35 (1994)Google Scholar
  100. [94G1]
    J.A. Gaj et al., Phys. Rev. B 50, 5512 (1994)CrossRefGoogle Scholar
  101. [94H1]
    W. Hackenberg et al., Semicond. Sci. Technol. 9, 1042 (1994)Google Scholar
  102. [94H2]
    W. Hackenberg and H.P. Hughes, Semicond. Sci. Technol. 9, 686 (1994)Google Scholar
  103. [94H3]
    W. Hackenberg et al., Phys. Rev. B 50, 10598 (1994)CrossRefGoogle Scholar
  104. [94L1]
    Z.-X. Liu et al., Solid State Electron. 37, 885 (1994)Google Scholar
  105. [94L2]
    G.-H. Li et al., Phys. Rev. B 50, 1575 (1994)Google Scholar
  106. [94M1]
    D.M. Mittlemen et al., Phys. Rev. B 49, 14435 (1994)Google Scholar
  107. [94P1]
    F.H. Pollok, Modulation Spectroscopy of Semiconductors and Semiconductor Microstructures; Handbook of Semiconductors, Elsevier, Amsterdm (1994)Google Scholar
  108. [94S1]
    D. Some and A.V. Nurmikko, Appl. Phys. Lett. 65, 3377 (1994)CrossRefGoogle Scholar
  109. [94S2]
    H. Stolz, Time-resolved Light-Scattering from Excitons, Springer Tracts Mod. Phys., Vol. 130, Springer, Berlin (1994)Google Scholar
  110. [95B1]
    D. Botkin et al., Rev. Sci. Instrum. 66, 4130 (1995)CrossRefGoogle Scholar
  111. [95B2]
    G. Bongiovanni, J. Butty and J-L. Staehli, Opt. Eng. 34, 1941 (1995)Google Scholar
  112. [95B3]
    L. Bányai et al., Phys. Rev. Lett. 75, 2188 (1995)Google Scholar
  113. [95D1]
    E. Daub and P. Würfel, Phys. Rev. Lett. 74, 1020 (1995)CrossRefGoogle Scholar
  114. [95G1]
    Gerthsen, Physik, 18th ed., Springer, Berlin (1995), presently available 22nd ed. (2003)Google Scholar
  115. [95K1]
    T.D. Krauss et al., Optics Lett. 20, 1110 (1995)CrossRefGoogle Scholar
  116. [95L1]
    D.J. Lovering and H.P. Hughes, 22nd Int. Conf. Phys. Semicond., Vancouver, Lockwood, D.J. (ed.), World Scientific, Singapore, Vol. 1, 209 (1995)Google Scholar
  117. [95L2]
    V. Langer, H. Stolz and W. von der Osten, Phys. Rev. B 51, 2103 (1995)CrossRefGoogle Scholar
  118. [95L3]
    W. Langbein, H. Hetterich and C. Klingshirn, Phys. Rev. B 51, 9922 (1995)Google Scholar
  119. [95M1]
    G. Mohs et al., Appl. Phys. Lett. 67, 1515 (1995)CrossRefGoogle Scholar
  120. [95P1]
    D.W. Pohl, Springer Ser. Surf. Sci., 2nd ed., 28, 232 (1995)Google Scholar
  121. [95U1]
    M. Umlauff et al., Phys. Rev. B 52, 5063 (1995)CrossRefGoogle Scholar
  122. [95V1]
    H. Vogelsang et al., 22nd Int. Conf. Phys. Semicond. Vancouver, Lockwood, D.J. (ed.), World Scientific, Singapore, Vol. 2, 1260 (1995)Google Scholar
  123. [95W1]
    Th. Weber et al., Semicond. Sci. Technol. 10, 1113 (1995)Google Scholar
  124. [95W2]
    S. Weiss et al., phys. stat. sol. (b) 188, 343 (1995)Google Scholar
  125. [95W3]
    P. Würfel, S. Finkbeiner and E, Daub, Appl. Phys. A 60, 67 (1995)Google Scholar
  126. [96A1]
    T.F. Albrecht et al., Phys. Rev. B 54, 4436 (1996)Google Scholar
  127. [96B1]
    D. Botkin et al., Appl. Phys. Lett. 69, 1321 (1996)CrossRefGoogle Scholar
  128. [96B2]
    K. Bott et al., J. Opt. Soc. Am. B 13, 1026 (1996)Google Scholar
  129. [96B3]
    J.J. Baumberg et al., J. Opt. Soc. Am. B 13, 1246 (1996)Google Scholar
  130. [96B4]
    D. Birkedal et al., Phys. Rev. B 54, R14250 (1996)CrossRefGoogle Scholar
  131. [96E1]
    S.A. Empedocles, D.J. Norris and M.G. Bawandi, Phys. Rev. Lett. 77, 3873 (1996)CrossRefGoogle Scholar
  132. [96H1]
    T. Ha, et al., Proc. Natl. Acad. Sci. USA, Biophysics 93, 6264 (1996)Google Scholar
  133. [96H2]
    M. Hübner et al., Phys. Rev. Lett. 76, 4199 (1996)Google Scholar
  134. [96H3]
    M. Hübner M. et al., 23rd Int. Conf. Phys. Semicond., Berlin; Scheffler and R. Zimmermann eds., World Scientific, Singapore, 1, 769 (1996)Google Scholar
  135. [96L1]
    Ch. Lienau et al., Appl. Phys. Lett. 69, 2471 (1996)Google Scholar
  136. [96L2]
    Ch. Lienau et al., Appl. Phys. Lett. 69, 325 (1996)Google Scholar
  137. [96M1]
    R.H. Mauch and H.-E. Gumlich eds., Inorganic and Organic Electroluminescence, Wiss.-und Technik-Verlag, Berlin (1996)Google Scholar
  138. [96M2]
    Merle d'Aubigné et al., Phys. Rev. B 54, 14003 (1996)Google Scholar
  139. [96O1]
    M. Oestreich, S. Hallstein and W.W. Rühle, IEEE J. Selected Topics Quantum Electron. 2, 747 (1996)CrossRefGoogle Scholar
  140. [96O2]
    M. Oestreich et al., Phys. Rev. B 53, 7911 (1996)CrossRefGoogle Scholar
  141. [96S1]
    J. Shah, Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures, Springer Ser. Solid-State Sci. 115, Springer, Berlin (1996)Google Scholar
  142. [96W1]
    M.U. Wehner, D. Steinbach and M. Wegener, Phys. Rev. B 54, R5211 (1996)CrossRefGoogle Scholar
  143. [96Y1]
    P.Y. Yu and M. Cardona, Fundamentals of Semiconductors, Springer, Berlin (1996)Google Scholar
  144. [96Y2]
    D.R. Yakovlev and K.V. Kavokin, Comments Condens. Matter Phys. 18, 51 (1996)Google Scholar
  145. [97A1]
    M.V. Artemyev, V. Sperling and U. Woggon, J. Appl. Phys. 81, 6975 (1997)CrossRefGoogle Scholar
  146. [97B1]
    G. Behme et al., Rev. Sci. Instrum. 68, 3458 (1997)CrossRefGoogle Scholar
  147. [97G1]
    M. Göppert et al., J. Lumin. 72–74, 430 (1997)Google Scholar
  148. [97G2]
    E.N. Glezer, NATO ASI Ser. B 356, 375, Plenum Press, New York (1997)Google Scholar
  149. [97H1]
    J. Hebeling et al., Optics Commun. 141, 229 (1997)Google Scholar
  150. [97H2]
    J.S. Hwang et al., J. Appl. Phys. 82, 3888 (1997)Google Scholar
  151. [97H3]
    High Magnetic Fields in the Physics of Semiconductors I and II, G. Landwehr and W. Ossau eds., World Scientific, Singapore (1997)Google Scholar
  152. [97K1]
    C. Klingshirn, phys. stat. sol. (b) 202, 857 (1997)CrossRefGoogle Scholar
  153. [97L1]
    W. Langbein et al., phys. stat. sol. (a) 164, 541 (1997)CrossRefGoogle Scholar
  154. [97L2]
    Ch. Lienau, A. Richter and J.W. Tomm, Appl. Phys. A 64, 341 (1997)CrossRefGoogle Scholar
  155. [97M1]
    E. Mazur, NATO ASI Ser. B 356, 4174, Plenum Press, New York (1997)Google Scholar
  156. [97M2]
    O.D. Mücke et al., phys. stat. sol. (b) 204, 556 (1997)Google Scholar
  157. [97N1]
    S. Nakamura and G. Fasol, G., The Blue Laser Diode, Springer, Berlin (1997)Google Scholar
  158. [97N2]
    M. Nuss and J. Bowers eds., OSA Trends in Optics and Photonics 13, X, 302 (1997)Google Scholar
  159. [97R1]
    A. Richter et al., phys. stat. sol. (b) 204, 247 (1997)CrossRefGoogle Scholar
  160. [97R2]
    A. Richter et al., Surf. Interf. Anal. 25, 583 (1997)Google Scholar
  161. [97W1]
    R. Westphäling et al., J. Lumin. 72–74, 980 (1997)Google Scholar
  162. [97W2]
    U. Woggon, Optical Properties of Semiconductor Quantum Dots, Springer Tracts Mod. Phys., Vol. 136, Springer, Berlin (1997)Google Scholar
  163. [97W3]
    M.U. Wehner, M.H. Ulm and M. Wegener, M., Opt. Lett. 22, 1455 (1997)Google Scholar
  164. [97Z1]
    R. Zimmermann, NATO ASI Ser. B 356, 123, Plenum Press, New York (1997)Google Scholar
  165. [98B1]
    R. v. Baltz, NATO ASI Ser. B 372, 323, Plenum Press, New York (1998)Google Scholar
  166. [98C1]
    T.F. Crimmins, R.M. Koehl and K.A. Nelson, NATO ASI Ser. B 372, 407, Plenum Press, New York (1998)Google Scholar
  167. [98D1]
    E. Dekel et al., Physica E 2, 777 (1998)Google Scholar
  168. [98D2]
    E. Dekel et al., Phys. Rev. Lett. 80, 4991 (1998)CrossRefGoogle Scholar
  169. [98F1]
    A.I. Ferguson, NATO ASI Ser. B 372, 233, Plenum Press, New York (1998)Google Scholar
  170. [98F2]
    G. v. Freymann, Th. Schimmel and M. Wegener, Appl. Phys. Lett. 73, 1170 (1998)Google Scholar
  171. [98G1]
    L.E. Golub et al., phys. stat. sol. (b) 205, 203 (1998)CrossRefGoogle Scholar
  172. [98I1]
    E.P. Ippen, NATO ASI Ser. B 372, 213, Plenum Press, New York (1998)Google Scholar
  173. [98J1]
    A. Jolk and C. Klingshirn, phys. stat. sol. (b) 206, 841 (1998)CrossRefGoogle Scholar
  174. [98J2]
    M. Jutte, W. von der Osten and H. Stolz, Opt. Commun. 157, 173 (1998)Google Scholar
  175. [98K1]
    H. Kuzmany, Solid State Spectroscopy, Springer, Berlin (1998) and more recent editionsGoogle Scholar
  176. [98K2]
    H. Kalt et al., J. Cryst. Growth 184/185, 627 (1998)Google Scholar
  177. [98K3]
    C. Klingshirn, NATO ASI Ser. B 372, 143, Plenum Press, New York (1998)Google Scholar
  178. [98K4]
    H. Kalt et al., Acta Phys. Polon. A 94, 139 (1998)Google Scholar
  179. [98K5]
    D.S. Kim et al., Phys. Rev. Lett. 80, 4803 (1998)Google Scholar
  180. [98K6]
    A. Knorr et al., phys. stat. sol. (b) 206, 139 (1998)CrossRefGoogle Scholar
  181. [98K7]
    R.A. Kaindl et al., Optics Lett. 23, 861 (1998)Google Scholar
  182. [98L1]
    S.G. Lipson, H. Lipson and D.S. Tannhauser, Optical Physics, Cambridge University Press, Cambridge (1998)Google Scholar
  183. [98L2]
    Ch. Lienau et al., Phys. Rev. B 58, 2045 (1998)CrossRefGoogle Scholar
  184. [98L3]
    S. Linden, H. Giessen and J. Kuhl, phys. stat. sol. (b) 206, 119 (1998)CrossRefGoogle Scholar
  185. [98P1]
    W. Petri et al., J. Crystl. Growth 184/185, 320 (1998)Google Scholar
  186. [98S1]
    I. Shtrickman et al., Physica E 2, 65 (1998)Google Scholar
  187. [98S2]
    D. Steinbach, W. Hügel and M. Wegener, JOSA B 15, 1231 (1998)CrossRefGoogle Scholar
  188. [98U1]
    M. Umlauff et al., Phys. Rev. B 57, 1390 (1998)CrossRefGoogle Scholar
  189. [98V1]
    A. Vertikov et al., Appl. Phys. Lett. 72, 2645 (1998)CrossRefGoogle Scholar
  190. [98W1]
    R. Westphäling et al., J. Appl. Phys. 84, 6871 (1998)Google Scholar
  191. [99A1]
    Ch. Adelmann et al., Appl. Phys. Lett. 74, 179 (1999)CrossRefGoogle Scholar
  192. [99B1]
    S.I. Bozhevolnyi, X. Mufei and J.M. Hvam, J. Opt. Soc. Am. A 16, 2649 (1999)Google Scholar
  193. [99C1]
    A. Cavalleri et al., J. Appl. Phys. 85, 3301 (1999)CrossRefGoogle Scholar
  194. [99D1]
    A. Dinger et al., phys. stat. sol. (b) 215, 413 (1999)CrossRefGoogle Scholar
  195. [99E1]
    A. Euteneuer et al., Phys. Rev. Lett. 83, 2073 (1999)CrossRefGoogle Scholar
  196. [99H1]
    E. Hecht, Optik, Oldenbourg, München (1999)Google Scholar
  197. [99H2]
    S.G. Hense and M. Wegener, Appl. Phys. Lett. 74, 920 (1999)CrossRefGoogle Scholar
  198. [99K1]
    J.C. Kim et al., Appl. Phys. Lett. 75, 214 (1999)Google Scholar
  199. [99K2]
    A. Klochkhin et al., Phys. Rev. B 59, 12947 (1999)Google Scholar
  200. [99L1]
    Ch. Lienau et al., Physica B 272, 96 (1999)CrossRefGoogle Scholar
  201. [99L2]
    W. Langbein, J.M. Hvam and R. Zimmermann, Phys. Rev. Lett. 82, 1040 (1999)CrossRefGoogle Scholar
  202. [99L3]
    S. Linden, J. Kuhl and H. Giessen, Opt. Lett. 24, 569 (1999)Google Scholar
  203. [99L4]
    D. Lüerssen et al., Appl. Phys. Lett. 75, 3944 (1999)Google Scholar
  204. [99L5]
    D. Lüerssen et al., Phys. Rev. B 59, 15862 (1999)Google Scholar
  205. [99R1]
    A. Richter et al., J. Microsc. 194, 393 (1999)CrossRefGoogle Scholar
  206. [99S1]
    V.F. Sapega et al., phys. stat. sol. (b) 215, 379 (1999)CrossRefGoogle Scholar
  207. [99V1]
    M. Vollmer et al., Appl. Phys. Lett. 74, 1791 (1999)CrossRefGoogle Scholar
  208. [99V2]
    M. Vollmer et al., J. Microsc. 194, 523 (1999)CrossRefGoogle Scholar
  209. [99W1]
    Q. Wu et al., Phys. Rev. Lett. 83, 2562 (1999)CrossRefGoogle Scholar
  210. [99W2]
    M. Wegener et al., Festkörperprobleme / Advances in Solid State Physcis 38, 297 (1999)Google Scholar
  211. [00D1]
    A. Dinger et al., J. Cryst. Growth 214/215, 847 (2000)Google Scholar
  212. [00D2]
    A. Dinger et al., phys. stat. sol. (b) 221, 485 (2000)CrossRefGoogle Scholar
  213. [00D3]
    A. Dinger et al., J. Cryst. Growth 214/215, 676 (2000)Google Scholar
  214. [00F1]
    G. v. Freymann et al., Appl. Phys. Lett. 76, 203 (2000)Google Scholar
  215. [00G1]
    M. Göppert et al., J. Cryst. Growth 214/215, 625 (2000)Google Scholar
  216. [00H1]
    R. Huber et al., Appl. Phys. Lett. 76, 3191 (2000)CrossRefGoogle Scholar
  217. [00H2]
    J. Hetzler et al., phys. stat. sol. (b) 221, 425 (2000)CrossRefGoogle Scholar
  218. [00K1]
    C. Klingshirn, Physik in unserer Zeit 31, 144 (2000)CrossRefGoogle Scholar
  219. [00L1]
    I.H. Libon et al., Appl. Phys. Lett. 76, 2821 (2000)CrossRefGoogle Scholar
  220. [01A1]
    Advances in Energy Transfer Processes, B. Di Bartolo ed., World Scientific, Hongkong (2001)Google Scholar
  221. [01K1]
    S. Kawata, M. Ohtsu and M. Irie, Nano Optics, Springer Series in Optical Sciences 84, Springer, Berlin (2001)Google Scholar
  222. [01K2]
    T.A. Klar, E. Engel and S.W. Hell, Phys. Rev. E 64, 066613 (2001)CrossRefGoogle Scholar
  223. [01K3]
    C. Klingshirn, in ref. [01A1] p165Google Scholar
  224. [01L1]
    Landolt-Börnstein, New Series, Group III, Vol. 34 C1 and 2, C. Klingshirn (ed.), Springer, Berlin (2001) and (2004)Google Scholar
  225. [01L2]
    Landolt-Börnstein, New Series, Group III, Vol. 34 B1 and 2, B. Kramer (ed.), Springer, Berlin (2001) and in preparationGoogle Scholar
  226. [01N1]
    Y. Nakamura et al., Phys. Rev. B 64, 075203 (2001)Google Scholar
  227. [02J1]
    A. Jolk, M. Jörger and C. Klingshirn, Phys. Rev. B 65, 245209 (2002)CrossRefGoogle Scholar
  228. [02K1]
    C. Klingshirn, T. Fleck and M. Jörger, phys. stat. sol. (b) 234, 23 (2002)CrossRefGoogle Scholar
  229. [02M1]
    O. Mücke et al., Optics Lett. 27, 2127 (2002) and Phys. Rev. Lett. 89, 127401 (2002)Google Scholar
  230. [02N1]
    Nano-Optoelectronics, M. Grundmann ed., Springer, Berlin, (2002)Google Scholar
  231. [02S1]
    W. Seitz et al., Opt. Soc. America, TOPS 72, 66 and 326 (2002)Google Scholar
  232. [02Z1]
    H. Zhao et al., Appl. Phys. Lett. 80, 1391 (2002)Google Scholar
  233. [03C1]
    A. Christ et al., Phys. Rev. Lett. 91, 183901 (2003) and ibib. 81, 2794 (2002)CrossRefGoogle Scholar
  234. [03D1]
    B. Dal Don et al., phys. stat. sol. c 0(4), 1237 (2003)Google Scholar
  235. [03F1]
    T. Fleck, M. Schmidt and C. Klingshirn, phys. stat. sol. (a) 198, 248 (2003)CrossRefGoogle Scholar
  236. [03H1]
    S.W. Hell, Nature Biotechnology 21, 1347 (2003)CrossRefGoogle Scholar
  237. [03K1]
    C. Klingshirn, T. Fleck and M. Jörger, phys. stat. sol. (b) 239, 261 (2003)CrossRefGoogle Scholar
  238. [03M1]
    S. Moehl et al., J. Appl. Phys. 93, 6265 (2003)CrossRefGoogle Scholar
  239. [03N1]
    N. Naka and N. Nagasawa, phys. stat. sol. (b) 238, 397 (2003)CrossRefGoogle Scholar
  240. [03S1]
    Spectroscopy of Systems with Spatially Confined Structures, B. Di Bartolo (ed.), NATO Science Series II, 90, Kluwer, Dordrecht, (2003)Google Scholar
  241. [03S2]
    E. Sorokin et al., Appl. Phys. B, 77, 245 (2003)CrossRefGoogle Scholar
  242. [03T1]
    J. Teipel et al., Appl. Phys. B, 77, 245 (2003) and CLEO, Baltimore, CMO3 (2003)CrossRefGoogle Scholar
  243. [03T2]
    T. Tritschler et al., SPIE Proc. 4992, 33 (2003) and phys. stat. sol. (b) 238, 561 (2003)Google Scholar
  244. [03Z1]
    H. Zhao et al., Phys. Rev. B 67, 035306 (2003) and phys. stat. sol. b 238, 529 (2003)Google Scholar
  245. [04C1]
    S. Chatterjee et al., Phys. Rev. Lett. 92, 067402 (2004)Google Scholar
  246. [04K1]
    J. Kvietkova et al., Thin Solid Films 455/456, 228 (2004) and Phys. Rev. B70, 045316 (2004)CrossRefGoogle Scholar
  247. [04K2]
    M. Kuwata-Gonokami et al., J. Phys. Soc. Japan 73, 1065 (2004)CrossRefGoogle Scholar
  248. [04S1]
    M. Schubert, Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons, Springer Tracts in Modern Physics, in press (2004)Google Scholar
  249. [05F1]
    Frontiers of Optical Spectroscopy, B. Di Bartolo ed., Kluwer, Dordrecht, in press (2005)Google Scholar

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