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SEMPA Studies of Thin Films, Structures, and Exchange Coupled Layers

  • H.P. Oepen
  • H. Hopster
Part of the NanoScience and Technology book series (NANO)

Abstract

Scanning electron microscopy with polarization analysis (SEMPA) has developed into a powerful technique to study domains in ultrathin films. In this chapter, we discuss from a very general point of view the instrumental aspects of the method. Examples of thin film investigations are given that demonstrate unique features of SEMPA. New solutions around apparent limitations of the technique are presented at the end, i.e., analyzing samples with contaminated surfaces and imaging in external fields.

Keywords

Domain Wall Domain Structure Secondary Electron Spin Reorientation Effective Anisotropy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Authors and Affiliations

  • H.P. Oepen
  • H. Hopster

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