Abstract
Lorentz microscopy has been used extensively for the past 40 years to study magnetic domain structure and magnetization reversal mechanisms in magnetic thin films and elements. In this chapter, the principal imaging and diffraction modes are reviewed, both qualitative and quantitative. In addition, a description of the instrumental and specimen requirements is included, and in the final section, the application of the various techniques to the study of spin-valve and spin-tunnel junction layered structures is discussed as a means of illustrating the type of information that can be obtained.
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References
M.E. Hale, H.W. Fuller and H. Rubenstein, J. Appl. Phys. 30, 789 (1959).
H. Boersch and H. Raith, Naturwissenschaften 46, 574 (1959).
J.N. Chapman, J.Phys. D: Appl. Phys. 17, 623 (1984).
H. Rose, Ultramicroscopy 2, 251 (1977).
J.P. Jakubovics, in Handbook of Microscopy: Applications in Materials Science, Solid State Physics and Chemistry, eds. S. Amelinckx et al., (VCH: Weinheim, New York, 1997) p. 505.
A. Hubert and R. Schäfer, Magnetic Domains (Springer-Verlag, Berlin, 1998).
J.N. Chapman and M.R. Scheinfein, J. Magn. Magn. Mater. 200, 729 (1999).
L. Reimer, Transmission electron microscopy: the physics of image formation and microanalysis, Springer Series in Optical Sciences 36 (Springer-Verlag, Berlin, 1994).
I.R. McFadyen and J.N. Chapman, EMSA Bulletin 22, 64 (1992).
R.C. Doole, A.K. Petford-Long and J.P. Jakubovics, Rev. Sci. Instrum. 64(4), 1038 (1993).
K. Tsuno and T. Taoka, Jap. J. Appl. Phys. 22, 1041 (1983).
K. Tsuno and M. Inoue, Optik 67, 363 (1984).
J.N. Chapman, R.P. Ferrier, L.J. Heyderman, S. McVitie, W.A.P. Nicholson, and B. Bormans, in Electron 15. Microscopy and Analysis (ed. A.J. Craven, IOPP, Bristol, 1993), 1.
J.N. Chapman, A.B. Johnston, L.J. Heyderman, S. McVitie, W.A.P. Nicholson and B. Bormans, IEEE Trans. Mag. 30, 4479 (1994).
D.B. Williams and C.B. Carter, Transmission Electron Microscopy (Plenum Press, New York, 1996).
Y. Aharanov and D. Bohm, Phys.Rev.115, 485 (1959).
J.N. Chapman, G.R. Morrison, J.P. Jakubovics, and R.A. Taylor, IOP Conf. Ser. 68, 197 (1984).
A.B. Johnston and J.N. Chapman, J. Microsc. 179, 119 (1995).
N.H. Dekkers and H. de Lang, Optik 41, 452 (1974).
G.R. Morrison, H. Gong, J.N. Chapman, and V. Hrnciar, J. Appl. Phys. 64, 1338 (1988).
G.R. Morrison and J.N. Chapman, Optik 64, 1 (1983).
J.N. Chapman, I.R. McFadyen and S. McVitie, IEEE Trans. Magn. 26, 1506 (1990).
A.C. Daykin and A.K. Petford-Long, Ultramicrosc. 58, 365 (1995).
S.J. Hefferman, J.N. Chapman and S. McVitie, J. Magn. Magn. Mat. 83, 223 (1990).
J.N. Chapman, L.J. Heyderman, S. McVitie and W.A.P. Nicholson, in Advanced Materials '95, Proc. 2nd NIRIM International Symposium on Advanced Materials (eds. Y. Bando, M. Kamo, H. Haneda, T. Aizaw — NIRIM, Japan), 23 (1995).
S. McVitie, J.N. Chapman, L. Zhou, L.J. Heyderman, and W.A.P. Nicholson, J. Magn. Magn. Mat. 148, 232 (1995).
K.J. Kirk, M.R. Scheinfein, J.N. Chapman, S. McVitie, M.F. Gillies, B.R. Ward, and J.G. Tennant, J. Phys. D: Appl. Phys. 34, 160 (2001).
X. Portier, A.K. Petford-Long, T.C. Anthony and J.A. Brug, IEEE Trans. Mag. 33(5), 3574 (1997).
X. Portier and A.K. Petford-Long, J. Phys. D.: Appl. Phys. 32, R89 (1999).
B. Dieny, V.S. Speriosu, S. Metin, S.S.P. Parkin, B.A. Gurney, P. Baumgart and D.R. Wilhoit, J. Appl. Phys. Rev. 69(8), 4774 (1991).
J.N. Chapman, P.R. Aitchison, K.J. Kirk, S. McVitie, J.C.S. Kools, and M.F. Gillies, J. Appl. Phys. 83, 5321 (1998).
X. Portier, A.K. Petford-Long, T.C. Anthony and J.A. Brug, J. Appl. Phys. 85(8), 4120–4126 (1999).
W.J. Gallagher, S.S.P. Parkin, Y. Lu, X.P. Bian, A. Marley, K.P. Roche, R.P. Altman, S.A. Rishton, C. Jahnes, T.M. Shaw and G. Xiao, J. Appl. Phys. 81, 3741 (1997).
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Petford-Long, A., Chapman, J. (2005). Lorentz Microscopy. In: Hopster, H., Oepen, H.P. (eds) Magnetic Microscopy of Nanostructures. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26641-0_4
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DOI: https://doi.org/10.1007/3-540-26641-0_4
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