Study of Ferromagnet-Antiferromagnet Interfaces Using X-Ray PEEM

  • A. Scholl
  • H. Ohldag
  • F. Nolting
  • S. Anders
  • J. Stöhr
Part of the NanoScience and Technology book series (NANO)


This chapter discusses polarization dependent X-ray photoemission electron microscopy (X-PEEM) and its application to coupled magnetic layers, in particular ferromagnet-antiferromagnet structures.


Magnetic Axis Exchange Bias Magnetic Origin Twin Domain PEEM Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • A. Scholl
  • H. Ohldag
  • F. Nolting
  • S. Anders
  • J. Stöhr

There are no affiliations available

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