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Magnetic Force Microscopy: Images of Nanostructures and Contrast Modeling

  • A. Thiaville
  • J. Miltat
  • J.M. García
Part of the NanoScience and Technology book series (NANO)

Abstract

Magnetic force microscopy is a scanning technique, derived from atomic force microscopy, that maps the magnetic interaction between a sample and a magnetic tip. It is simple to use (most microscopes operate in ambient conditions) and provides images with a resolution down to 20 nm in best cases. The images do not, however, correspond directly to the sample magnetization, because of the long range of magnetic forces, their complex sources, as well as the potentially perturbing effect of tip-sample interaction. The emphasis of this chapter is on contrast modeling, especially in nanostructures.

Keywords

Domain Wall Vortex Core Magnetic Force Microscopy Volume Charge Contrast Modeling 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • A. Thiaville
  • J. Miltat
  • J.M. García

There are no affiliations available

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