Optimal Scaling Methodologies and Transistor Performance

  • T. Skotnicki
  • F. Boeuf
Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 16)


Virtual Cathode Gate Leakage Schottky Junction Double Gate Equivalent Oxide Thickness 


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© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • T. Skotnicki
  • F. Boeuf

There are no affiliations available

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