High-k Gate Dielectric Materials Integrated Circuit Device Design Issues

  • Y.-Y. Fan
  • S.P. Mudanai
  • W. Chen
  • L.F. Register
  • S.K. Banerjee
Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 16)


Gate Electrode Barium Strontium Titanate Interface State Density Gate Capacitance Direct Tunneling 
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© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • Y.-Y. Fan
  • S.P. Mudanai
  • W. Chen
  • L.F. Register
  • S.K. Banerjee

There are no affiliations available

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