Test generation for large-scale combinational circuits by using Prolog

  • Yoshihiro Tohma
  • Kenji Goto
Part of the Lecture Notes in Computer Science book series (LNCS, volume 315)


This paper presents a method to improve the execution of Prolog programs which generate tests of very large combinational circuits. Essentially, we restrict the area where the 4-valued unification will be performed and exploit the knowledge of tests for component modules of large circuits. Examples are given to demonstrate the improvement achieved by this method.

Index Terms

Prolog Knowledge Test Module Acceleration 


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Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • Yoshihiro Tohma
    • 1
  • Kenji Goto
    • 1
  1. 1.Department of Computer ScienceTokyo Institute of TechnologyTokyoJapan

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