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Built-in self-testing of logic circuits using imperfect duplication

  • R. Kh. Latypov
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 278)

Abstract

The method of built-in self-testing is proposed using imperfect duplication. As an example reducing the value of the average probability of missing a fault in the case of BIST of single-output combinational circuit has been shown.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1987

Authors and Affiliations

  • R. Kh. Latypov
    • 1
  1. 1.Kazan state universityUSSR

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