Abstract
The method of built-in self-testing is proposed using imperfect duplication. As an example reducing the value of the average probability of missing a fault in the case of BIST of single-output combinational circuit has been shown.
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© 1987 Springer-Verlag Berlin Heidelberg
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Latypov, R.K. (1987). Built-in self-testing of logic circuits using imperfect duplication. In: Budach, L., Bukharajev, R.G., Lupanov, O.B. (eds) Fundamentals of Computation Theory. FCT 1987. Lecture Notes in Computer Science, vol 278. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-18740-5_59
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DOI: https://doi.org/10.1007/3-540-18740-5_59
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