Advertisement

Review of the possibilities of electron microscopy in the identification of defect structures

  • J. Heydenreich
Part I. Defect Diagnostics
Part of the Lecture Notes in Physics book series (LNP, volume 175)

Keywords

Screw Dislocation Scanning Transmission Electron Microscopy Crystal Defect Deep Level Transient Spectroscopy Electron Beam Induce Current 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    J. Chikawa, S. Shirai, Jap. J. Appl. Phys. 18, Suppl. 18-1, 153 (1979)Google Scholar
  2. 2.
    P.B. Hirsch, R.W. Horne, M.J. Whelan, Phil. Mag. 1, 677 (1956)Google Scholar
  3. 3.
    W. Bollmann, Phys. Rev. 103, 1588 (1956)Google Scholar
  4. 4.
    P.B. Hirsch, A. Howie, R.B. Nicholson, M.J. Whelan, D.W. Pashley, Electron Microscopy of Thin Crystals, London, Butterworths (1965)Google Scholar
  5. 5.
    G. Thomas, M.J. Goringe, Transmission Electron Microscopy of Materials, New York, Wiley & Sons (1979)Google Scholar
  6. 6.
    A.K. Head, Aust. J. Phys. 20, 557 (1967)Google Scholar
  7. 7.
    P. Humble, Aust. J. Phys. 21, 325 (1968)Google Scholar
  8. 8.
    K. Scheerschmidt, J. Heydenreich, phys. status solidi(a) 42, 47 (1977)Google Scholar
  9. 9.
    D.J.H. Cockayne, I.L.F. Ray, M.J. Whelan, Phil. Mag. 20, 1265 (1969)Google Scholar
  10. 10.
    D.J.H. Cockayne, A. Hons, J. Phys. (Paris) 40, C6–11 (1979)Google Scholar
  11. 11.
    J.C.H. Spence, Experimental High-Resolution Electron Microscopy, Oxford, Clarendon Press (1981)Google Scholar
  12. 12.
    J.W. Menter, Proc. Roy. Soc. (London) A236, 119 (1956)Google Scholar
  13. 13.
    J.C.H. Spence, J.M. Cowley, R. Gronsky, Ultramicroscopy 4, 429 (1979)Google Scholar
  14. 14.
    K. Izui, S. Foruno, H. Otsu, J. Electron Micr. 26, 129 (1977)Google Scholar
  15. 15.
    J.L. Hutchison, C.J. Humphreys, A. Ourmazd, P.B. Hirsch, Proc. 7th Europ. Reg. Conf. Electr. Micr., The Hague 1980, Vol.I, P.304Google Scholar
  16. 16.
    T.Y. Tan, H. Föll, S.M. Hu, Phil. Mag. A44, 127 (1981)Google Scholar
  17. 17.
    I.G. Salisbury, M.H. Loretto, Phil. Mag. A39, 317 (1979)Google Scholar
  18. 18.
    J.A. Lambert, P.S. Dobson, Phil. Mag. A44, 1043 (1981)Google Scholar
  19. 19.
    M. Pasemann, Z. Lilienthal, J. Microsc. Spectrosc. Electron. 6, 123 (1981)Google Scholar
  20. 20.
    I.L. Krivanek, J.H. Mazur, Appl. Phys. Lett. 37, 392 (1980)Google Scholar
  21. 21.
    G.W. Cullen, M.S. Abrahams, J.F. Corboy, M.T. Duffy, W.E. Ham, L. Jastrzebski, R.T. Smith, M. Blumenfeld, G. Harbeke, J. Lagowski, J. Cryst. Growth 56, 281 (1982)Google Scholar
  22. 22.
    Proc. Int. Symp. In-Situ High Voltage Electron Microscopy, Halle 1979; in: Cryst. Res. Technol. 14, 1169 (1979)Google Scholar
  23. 23.
    H. Fujita, Y. Kawasaki, E. Furubayashi, S. Kajiwara, H. Taoka, Jap. J. Appl. Phys. 6, 214 (1967)Google Scholar
  24. 24.
    C.J. Varker, K.V. Ravi, J. Appl. Phys. 45, 272 (1974)Google Scholar
  25. 25.
    A. Ourmazd, D.B. Darby, G.R. Booker, Inst. Phys. Conf. Ser. No. 36, 251 (1977)Google Scholar
  26. 26.
    P.M. Petroff, D.V. Lang, J.L. Strudel, A. Savage, Proc. 9th Int. Congr. El-Micr., Toronto 1978, Vol.I, p.130Google Scholar
  27. 27.
    J. Heydenreich, H. Blumtritt, R. Gelichmann, H. Johansen, J. Phys. (Paris) 40, C6–23 (1979)Google Scholar
  28. 28.
    D. Fathy, T.G. Sparrow, U. Valdrè, J. Micr. (London) 118,263 (1980)Google Scholar
  29. 29.
    H. Leamy, J. Appl. Phys. 53, R51 (1982)Google Scholar
  30. 30.
    C. Donalato, Optic 52, 19 (1978)Google Scholar
  31. 31.
    L. Pasemann, Ultramicroscopy 6, 237 (1981)Google Scholar
  32. 32.
    G.R. Booker, A. Ourmazd, D.B. Darby, J. Phys. (Paris) 40, C6–19 (1979)Google Scholar
  33. 33.
    J. Heydenreich, H. Blumtritt, R. Gelichmann, H. Johansen, Scanning Electron Microscopy 1981/1 (Eds. P. Becker, O. Johari) Chicago, SEM Inc. 1981, p.315Google Scholar
  34. 34.
    H. Blumtritt, R. Gleichmann, J. Heydenreich, H. Johansen, physica status solidi (a) 55, 611 (1979)Google Scholar
  35. 35.
    H. Menniger, H. Raidt, R. Gleichmann, physica status solidi (a) 58, 173 (1980)Google Scholar
  36. 36.
    M. Kittler, W. Seifert, Cryst. Res. Technol. 16, 157 (1981)Google Scholar
  37. 37.
    J. Heydenreich, H. Blumtritt, R. Gleichmann, H. Johansen, Cryst. Res. Technol. 16, 133 (1981)Google Scholar
  38. 38.
    A. Ourmazd, E. Weber, H. Gottschalk, G.R. Booker, H. Alexander, Inst. Phys. Conf. Ser. No.60, Sect.I, 63 (1981)Google Scholar

Copyright information

© Springer-Verlag 1983

Authors and Affiliations

  • J. Heydenreich
    • 1
  1. 1.Institut für Festkörperphysik und ElektronenmikroskopieAkademie der Wissenschaften der DDRHalleDDR

Personalised recommendations