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On the field dependence of capture and emission processes at deep centres

  • H. Klose
  • K. Irmscher
  • K. Maass
Part III. Defects in Silicon
Part of the Lecture Notes in Physics book series (LNP, volume 175)

Keywords

Emission Rate Electric Field Strength Pulse Voltage Reverse Bias Space Charge Region 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 1983

Authors and Affiliations

  • H. Klose
    • 1
  • K. Irmscher
    • 1
  • K. Maass
    • 1
  1. 1.Sektion PhysikHumboldt-Universität zu BerlinBerlinGermany

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