Abstract
Epitaxial layers of n-PbTe with mobilities up to 4×106 cm2/Vs at 4 K were grown by the hot-wall technique. The experimental data can be explained in terms of ionized-defect scattering, usina a potential consisting of a Coulomb part and a short-range part, together with the correct low-temperature value for the static dielectric constant (ε = 1300).
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Palmetshofer, L., Gresslehner, K.H., Ratschbacher, L., Lopez-Otero, A. (1982). Ionized-defect-scattering mobility in n-PbTe. In: Gornik, E., Heinrich, H., Palmetshofer, L. (eds) Physics of Narrow Gap Semiconductors. Lecture Notes in Physics, vol 152. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-11191-3_68
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DOI: https://doi.org/10.1007/3-540-11191-3_68
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