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Radiation effects in silicon charge-coupled devices

  • J. M. Killiany
Chapter
Part of the Topics in Applied Physics book series (TAP, volume 38)

Keywords

Voltage Shift Minority Carrier Lifetime Interface State Density Input Gate Dark Current Density 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 1980

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  • J. M. Killiany

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