Advertisement

Electron detectors

  • Elmar Zeitler
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 112)

Keywords

Primary Energy Primary Electron Sensitive Volume Detective Quantum Efficiency Channel Electron Multiplier 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    W. E. Mott, R. B. Sutton, Encyclopedia of Physics, vol. 45, ed. S. Flugge (Berlin: Springer-Verlag).Google Scholar
  2. 2.
    T. Jorgensen, Amer. J. Phys. 6: 285 (1948).Google Scholar
  3. 3.
    R. Clarke Jones, Adv. El. and Elec. Phys. 11: 87 (1959).Google Scholar
  4. 4.
    W. Heitler, Quantum theory of radiation (Oxford: Oxford University Press).Google Scholar
  5. 5.
    N. F. Mott, H. S. W. Massey, The theory of atomic collisions (Oxford: Oxford University Press).Google Scholar
  6. 6.
    H. Niedrig, Scanning Electron Microscopy 1978, ed. 0. Johari, vol. 1, p. 841.Google Scholar
  7. 7.
    F. Arnal, P. Verdier, P. D. Vincensini, C. R. Acad. Sci. B268: 1526 (1969).Google Scholar
  8. 8.
    H. Kulenkampff, W. Spyra, Z. Phys. 137: 416 (1954).Google Scholar
  9. 9.
    E. J. Sternglass, Phys. Rev. 95: 345 (1954).Google Scholar
  10. 10.
    E.g., H. Seiler, Z. Angew. Phys. 22: 249 (1967).Google Scholar
  11. 11.
    L. Katz, A. S. Penfold, Rev. Mod. Phys. 24: 28 (1952).Google Scholar
  12. 12.
    U. Fano, Phys. Rev. 72: 26 (1947).Google Scholar
  13. 13.
    L. Reimer, Optik 27: 86 (1968).Google Scholar
  14. 14.
    F. Bordini, Nucl. Inst. Meth. 97: 405 (1970).Google Scholar
  15. 15.
    J. M. Taylor, Semiconductor particle detectors (London: Butterworths, 1963).Google Scholar
  16. 16.
    G. Bertolini, A. Coche, Semiconductor detectors (Amsterdam: North-Holland, 1968).Google Scholar
  17. 17.
    T. E. Everhart, R. F. M. Thornley, J. Sci. Inst. 37: 246 (1960).Google Scholar
  18. 18.
    H. Feist, D. Harder, R. Metzner, Nucl. Inst. and Meth. 58: 236 (1968).Google Scholar
  19. 19.
    K.-H. Herrmann, D. Krahl, H.-P. Rust, Ultramicroscopy 3: 227 (1978).Google Scholar
  20. 20.
    E. Zeitler, J. R. Hayes, Lab. Invest. 14: 1324 (1965).Google Scholar
  21. 21.
    C. E. K. Mees, The theory of the photographic process (New York: Macmillan, 1942).Google Scholar
  22. 22.
    R. C. Valentine, Lab. Invest. 14: 1334 (1965).Google Scholar
  23. 23.
    J. F. Hamilton, J. C. Marchant, J.O.S.A. 57: 232 (1967).Google Scholar

Copyright information

© Springer-Verlag 1980

Authors and Affiliations

  • Elmar Zeitler
    • 1
  1. 1.Teilinstitut für Elektronenmikroskopie am Fritz-Haber-Institut der Max-Planck-GesellschaftBerlin (West) 33

Personalised recommendations