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Electron detectors

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Imaging Processes and Coherence in Physics

Part of the book series: Lecture Notes in Physics ((LNP,volume 112))

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Author information

Authors and Affiliations

  1. Teilinstitut für Elektronenmikroskopie am Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 1000, Berlin (West) 33

    Elmar Zeitler

Authors
  1. Elmar Zeitler
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Editor information

M. Schlenker M. Fink J. P. Goedgebuer C. Malgrange J. Ch. Vieénot R. H. Wade

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© 1980 Springer-Verlag

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Zeitler, E. (1980). Electron detectors. In: Schlenker, M., Fink, M., Goedgebuer, J.P., Malgrange, C., Vieénot, J.C., Wade, R.H. (eds) Imaging Processes and Coherence in Physics. Lecture Notes in Physics, vol 112. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-09727-9_111

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  • DOI: https://doi.org/10.1007/3-540-09727-9_111

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-09727-3

  • Online ISBN: 978-3-540-38541-7

  • eBook Packages: Springer Book Archive

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